Multitechnique depth profiling of small molecules in polymeric matrixes

Valenty, S. J.; Chera, John J.; Olson, D. R.; Webb, K. K.; Smith, Gary A.; Katz, W.

doi:10.1021/ja00333a006

Cited by 19 publications

(6 citation statements)

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“…In addition, the sputter rate is significantly reduced when employing atomic beams, such that only dynamic SIMS instruments are typically used. There are several examples of polymeric depth profiling with atomic beams including PS (Whitlow & Wool, 1989, 1991Zhao et al, 1991;Shwarz et al, 1992;Liu et al, 1995;Zheng et al, 1995;Strzhemechny et al, 1997;Rysz et al, 1999;Yokoyama et al, 1999;Shin et al, 2001;Hu et al, 2003;Lin et al, 2003;Harton, Stevie, & Ade, 2006a,b,c;Harton et al, 2006d), PAMA (Valenty et al, 1984), PBMA (Verhoeven et al, 2004), PEVA (Verhoeven et al, 2004), PC (Valenty et al, 1984), PVDF (Chujo, 1991), PEO (Mattsson et al, 2000;Huang et al, 2001), PMMA (Chujo, 1991;Huang et al, 2001;Hu et al, 2003;Harton, Stevie, & Ade, 2006a,b,c;Harton et al, 2006d), polydimethyl phenylene oxide (PDPO) (Lin et al, 2003), PVP (Zheng et al, 1995;Pinto, Novak, & Nicholas, 1999;Yokoyama et al, 1999;Harton, Stevie, & Ade, 2006a,b;Harton et al, 2006d), PPV and other polymer based LED materials Bulle-Lieuwma & van de Weijer, 2006), solar cell materials (Bulle-Lieuwma et al, 2003), conducting polymers (Gray et al, 1992), video tapes (Chujo, 1991), silicones …”

Section: B Atomic Ion Bombardment Of Polymersmentioning

confidence: 99%

Cluster secondary ion mass spectrometry of polymers and related materials

Mahoney

2009

Mass Spectrometry Reviews

283

329

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Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the characterization of polymeric materials over the last decade, allowing for the ability to obtain spatially resolved surface and in-depth molecular information from many polymer systems. With the advent of new molecular sources such as C(60)(+), Au(3)(+), SF(5)(+), and Bi(3)(+), there are considerable increases in secondary ion signal as compared to more conventional atomic beams (Ar(+), Cs(+), or Ga(+)). In addition, compositional depth profiling in organic and polymeric systems is now feasible, without the rapid signal decay that is typically observed under atomic bombardment. The premise behind the success of cluster SIMS is that compared to atomic beams, polyatomic beams tend to cause surface-localized damage with rapid sputter removal rates, resulting in a system at equilibrium, where the damage created is rapidly removed before it can accumulate. Though this may be partly true, there are actually much more complex chemistries occurring under polyatomic bombardment of organic and polymeric materials, which need to be considered and discussed to better understand and define the important parameters for successful depth profiling. The following presents a review of the current literature on polymer analysis using cluster beams. This review will focus on the surface and in-depth characterization of polymer samples with cluster sources, but will also discuss the characterization of other relevant organic materials, and basic polymer radiation chemistry.

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Section: B Atomic Ion Bombardment Of Polymersmentioning

confidence: 99%

Cluster secondary ion mass spectrometry of polymers and related materials

Mahoney

2009

Mass Spectrometry Reviews

283

329

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“…Deuterium labeling in combination with dynamic SIMS has proven its usefulness for this purpose [37][38][39] . To be able to make depth profiles of the methanofullerenes in the photoactive films with MDMO-PPV a deuterated methanofullerene (d5-PCBM) has been synthesized with five deuterium atoms on the phenyl ring (see Figure 1).…”

Section: Depth Profiling With Tof-simsmentioning

confidence: 99%

Relating the morphology of a poly(p-phenylene vinylene)/methanofullerene blend to bulk heterojunction solar cell performance

et al. 2004

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Few techniques are available where the morphology of blends can be determined in all three dimensions on a nanometer scale. Here we describe the use of a combination of techniques to resolve the morphology both laterally and vertically in spin cast films of a poly(p-phenylene vinylene)/methanofullerene blend. These blends are used as photoactive films in plastic bulk heterojunction solar cells where the performance strongly depends on the molecular morphology. In addition to depth profiling by dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS), tapping-mode atomic force microscopy (TM-AFM), transmission electron microscopy (TEM), absorption and emission spectroscopy and time-correlated single photon counting fluorescence measurements were used to investigate the morphology of ~100 nm thick spin cast composites with varying composition of 1-(3-methoxycarbonyl)propyl-1-phenyl-[6,6]-methanofullerene (PCBM) and poly[2-methoxy-5-(3′,7′-dimethyloctyloxy)-1,4-phenylene vinylene] (MDMO-PPV). Combining all results showed clustering of PCBM into rather pure separate domains in a matrix of ~50 wt% MDMO-PPV for composites with PCBM concentrations 80-100 wt%, and no spontaneous stratification. Electrical characterization, under illumination and in the dark, of the composite devices revealed the percolation threshold for electron transport and showed a reduction in recombination-limitation for the photocurrent of these solar cells as a result of an improved charge transport and collection efficiency with increasing fullerene concentration.

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“…HREELS is the sole electron spectroscopy that could detect this type of effect at the very surface of the composite polymeric films; moreover, it is probable that this effect could not be evidenced by any optical spectroscopy (26). Both dynamic depth profiling SIMS and high-energy ion scattering have detected this phenomenon in blends of polystyrene and deuterated polystyrene (27,28).…”

Section: Rent Analyticalmentioning

confidence: 99%

“…Besides the dynamic SIMS depth profile work on labeled polymers mentioned earlier (27), a series of very exciting experiments using dynamic SIMS depth profiling on block copolymer thin films by Russell et al were recently described in an overview (45). This work shows the power of focusing strictly on elemental ions in determining profiles; where unique isotropic tags can be used to identify one component, complex different ion formation mechanisms can be ignored.…”

Section: Static Simsmentioning

confidence: 99%

Analysis of polymer surfaces using electron and ion beams

Gardella¹,

Pireaux²

1990

Anal. Chem.

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When materials science emerged as one of the important research areas in the 1980s, chemists were encouraged to become more involved in interdisciplinary and multidisciplinary efforts in the field (1). Today, interest continues unabated and chemists are making contributions in areas ranging from material synthesis and characterization to the details of development and device engineering. One emphasis in materials science involves surface and interfacial concerns, and this is an area in which advances in basic science rapidly transfer to technology (2).Materials scientists and engineers are now focusing more attention on polymers because of their increasing usefulness in the marketplace. Polymers are an inexpensive alternative for traditional structural materials: in fact, the volume of polymers produced worldwide has surpassed that of steel.

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Multitechnique depth profiling of small molecules in polymeric matrixes

Abstract: Science Foundation under Grants CHE78-04258 and CHE81-10541. K. Hagen is grateful to the Norwegian Research Council for Science and the Humanities for partial support and a travel grant.

Cited by 19 publications

References 0 publications

Cluster secondary ion mass spectrometry of polymers and related materials

Cluster secondary ion mass spectrometry of polymers and related materials

Relating the morphology of a poly(p-phenylene vinylene)/methanofullerene blend to bulk heterojunction solar cell performance

Analysis of polymer surfaces using electron and ion beams

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