Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

Favre‐Nicolin, V.; Proietti, M. G.; Leclère, C.; Katcho, Nebil A.; Richard, Marie-Ingrid; Renevier, H.

doi:10.1140/epjst/e2012-01619-x

Cited by 23 publications

(22 citation statements)

References 92 publications

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“…Also worthy of mention are anomalous X-ray scattering methods, such as multiwavelength anomalous diffraction (MAD) and diffraction anomalous fine structure (DAFS) [12]. Methods using nanobeam X-ray diffraction (NBXD) [13] have been intensively developed in recent years.…”

Section: Introduction Methods Of Research On Structures With Quantummentioning

confidence: 99%

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High-resolution X-ray diffraction in crystalline structures with quantum dots

Пунегов¹

2015

Phys.-Usp.

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We review the current status of nondestructive highresolution X-ray diffractometry research on semiconductor structures with quantum dots (QDs). The formalism of the statistical theory of diffraction is used to consider the coherent and diffuse X-ray scattering in crystalline systems with nanoinclusions. Effects of the shape, elastic strain, and lateral and vertical QD correlation on the diffuse scattering angular distribution near the reciprocal lattice nodes are considered. Using short-period and multicomponent superlattices as an example, we demonstrate the efficiency of data-assisted simulations in the quantitative analysis of nanostructured materials. Contents 1. Introduction. Methods of research on structures with quantum dots 419 2. High-resolution X-ray diffraction 420 2.1 Triple-axis X-ray diffractometry; 2.2 Statistical theory of X-ray diffraction. Coherent and diffuse scattering; 2.3 Direct and inverse X-ray diffraction problems 3. X-ray diffraction in structured media 423 3.1 Multilayer quantum dots; 3.2 Semiconductor structures with self-organized quantum dots; 3.3 Diffraction on 3D periodic quantum dot arrays 4. Influence of the quantum dot shape, size, and elastic strain on X-ray diffuse scattering 426 4.1 Diffuse scattering from epitaxial structures with quantum dots of different shapes; 4.2 Spheroidal quantum dots 5. Spatial correlations in the arrangement of quantum dots 432 5.1 Lateral correlation of quantum dots. Short-range order; 5.2 Vertical correlation of quantum dots 6. Quantitative X-ray diffraction analysis of heterostructures with quantum dots 437 6.1 Short-period superlattices with quantum dots; 6.2 Multicomponent heterostructures with quantum dots 7. Conclusion 443 References 443 Physics ± Uspekhi 58 (5) 419 ± 445 (2015) # 2015 Uspekhi Fizicheskikh Nauk, Russian Academy of Sciences V I Punegov Physics ± Uspekhi 58 (5) V I Punegov Physics ± Uspekhi 58 (5) V I Punegov Physics ± Uspekhi 58 (5)

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Section: Introduction Methods Of Research On Structures With Quantummentioning

confidence: 99%

“…whereẽ s rr n n is given by (12). The diffuse scattering amplitude in (10) can be represented as the sum of two terms,…”

Section: Diffuse Scattering From Epitaxial Structures With Quantum Domentioning

confidence: 99%

High-resolution X-ray diffraction in crystalline structures with quantum dots

Пунегов¹

2015

Phys.-Usp.

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“…ÅAEÇẽ s rr n n ÊÂAEÂÈÕÔâ ÔÑÑÕÐÑÛÇÐËÇÏ (12). ¡ÏÒÎËÕÖAEÖ AEË××ÖÊÐÑÅÑ ÓÂÔÔÇâÐËâ Ä (10) ÒÓÇAEÔÕÂÄËÏ Ä ÄËAEÇ ÔÖÏÏÞ AEÄÖØ ÔÎÂÅÂÇÏÞØ: …”

Section: ³õâõëôõëúçôíââ õçñóëâ óçðõåçðñäôíñì Aeë×óâíùëëunclassified

High-resolution X-ray diffraction in crystalline structures with quantum dots

Пунегов¹

2015

Usp. Fiz. Nauk

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“…Thus, the local atomic configuration and chemical state can be determined around a certain element at a particular crystallographic site of a unit cell and also in a particular crystalline phase of a sample. Pioneering DAFS studies, including theoretical introductions, have been reported (Renevier et al, 1997;Cross et al, 1998;Meyer et al, 1999;Proietti et al, 1999;Lee et al, 2006;Joly et al, 2008) and reviewed (Sorensen et al, 1994;Favre-Nicolin et al, 2012;Palancher et al, 2012;Zschornak et al, 2014). However, there have been few reports on the application of DAFS to practical materials, which often require specific types of investigations (such as a time-series variation associated with the durability and degradation of product performances), presumably because of the two scientific challenges discussed below.…”

Section: Introductionmentioning

confidence: 99%

“…Stragier et al (1992) divided a DAFS spectrum into smooth and oscillating parts and extracted spectrum oscillations by fitting the smooth part with a theoretically calculated profile. This calculation method has subsequently inspired analyses of data for extended diffraction anomalous fine structure (EDAFS), which is analogous to extended X-ray absorption fine structure (EXAFS) (Favre-Nicolin et al, 2012), but the method is not applicable to analyses of data for diffraction anomalous near-edge structure (DANES), which corresponds to X-ray absorption near-edge structure. Pickering et al (1993) and Vacínová et al (1995) proposed the iterative-fitting method, by which an entire DAFS spectrum is fitted using presumed f 0 ðEÞ or f 00 ðEÞ values.…”

Section: Introductionmentioning

confidence: 99%

Revisit to diffraction anomalous fine structure

et al. 2014

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The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe 3 O 4 powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method.

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Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

Cited by 23 publications

References 92 publications

High-resolution X-ray diffraction in crystalline structures with quantum dots

High-resolution X-ray diffraction in crystalline structures with quantum dots

High-resolution X-ray diffraction in crystalline structures with quantum dots

Revisit to diffraction anomalous fine structure

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