2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAI 2023
DOI: 10.1109/metroxraine58569.2023.10405706
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Museum accessibility: A Managerial Perspective on Digital Approach

Gesualda Iodice,
Francesco Carignani,
Laura Clemente
et al.
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