We have performed fluorescence x-ray-absorption fine-structure ͑XAFS͒ measurements from 20-200 K on a 5000-Å c-axis film of YBa 2 Cu 3 O 7Ϫ␦ ͑YBCO͒ on MgO (T c ϭ89 K͒ using photons polarized perpendicular to the film. The quality of the data is high out to 16 Å Ϫ1 . The data from 3-15.5 Å Ϫ1 were transformed into r space and fit to a sum of theoretical standards out to 4.0 Å. These data are compared to YBCO data from a single crystal and from a film on LaAlO 3 with the same T c . The main difference between the single crystal and the film data is that while the single-crystal data are well described by a two-site axial oxygen ͓O͑4͔͒ distribution, we see no evidence for such a distribution in either thin-film sample. We place an upper limit on the size of the axial oxygen distribution splitting for the film on MgO at ⌬ r Շ0.09 Å. Therefore, the magnitude of any possible splitting is not directly related to T c . Fits to the temperature-dependent data from the YBCO film on MgO indicate that all bonds show a smooth change of their broadening factor , except the Cu-O͑4͒ bonds, which show an increase in in the vicinity of T c , followed by a decrease of the same magnitude. Such a feature does not occur in diffraction measurements. Since XAFS measurements of include any correlation between the atoms in a given bond, we conclude that the O͑4͒ position becomes less correlated with the Cu positions near T c . Correlation measurements of these and several further near neighbors are also reported.