The periodic bulk structures of metal-organic frameworks (MOFs) can be solved by diffraction-based techniques; however, their non-periodic local structures-such as crystal surfaces, grain boundaries, defects, and guest molecules-have long been elusive due to a lack of suitable characterization tools. Recent advances in (scanning) transmission electron microscopy ((S)TEM) has made it possible to probe the local structures of MOFs at atomic resolution. In this article, we discuss why high-resolution (S)TEM of MOFs is challenging and how the new low-dose techniques overcome this challenge, and we review various MOF structural features observed by (S)TEM and important insights gained from these observations. Our discussions focus on real-space imaging, excluding other TEM-related characterization techniques (e.g. electron diffraction and spectroscopy). M etal-organic frameworks (MOFs) comprise metal centres/clusters with organic coordinating ligands and are characterized by their designable topologies, porosity, and functionalities 1,2. Studies on the structure-property relationship of MOFs are mainly based on their periodic crystallographic structures solved by diffraction-based techniques. In fact, the local non-periodic structures of MOFs-such as crystal surfaces, boundaries/interfaces, guest molecules, and point or extended defects-also have important effects on the properties of mass transport, sorption, and catalysis; for example, defects and interfaces severely affect how MOF membranes separate gases 3,4. However, probing local structures in MOF crystals with high spatial resolution is difficult, which poses a challenge to establishing a correlation between the properties of a MOF and its local structures with atomic precision. High-resolution transmission electron microscopy (HR-TEM) is the most widely used tool for imaging non-periodic local structures of crystalline materials, which are invisible in diffraction 5,6. Unfortunately, MOFs are extremely sensitive to the electron beam irradiation and their structures can be easily damaged during HR-TEM imaging 7-9. In fact, high-resolution