Proceedings of the 45th Annual Design Automation Conference 2008
DOI: 10.1145/1391469.1391606
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N-variant IC design

Abstract: We propose the first method for designing N-variant sequential circuits. The flexibility provided by the N-variants enables a number of important tasks, including IP protection, IP metering, security, design optimization, self-adaptation and fault-tolerance. The method is based on extending the finite state machine (FSM) of the design to include multiple variants of the same design specification. The state transitions are managed by added signals that may come from various triggers depending on the target appl… Show more

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Cited by 11 publications
(1 citation statement)
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“…For example, silicon‐based PUFs which generate unique identifiers based on process variations can only detect cloned, overproduced, and remarked ICs. [ 51,139,140 ] Similarly, hardware metering enables detection of overproduced ICs post‐fabrication, [ 141,142 ] while other approaches like secure split test [ 143 ] and electronic chip ID [ 144 ] detect cloned and defective/out‐of‐spec ICs. Interestingly, none address the issue of recycled ICs.…”
Section: D‐material‐based Watermarking and Anticounterfeitsmentioning
confidence: 99%
“…For example, silicon‐based PUFs which generate unique identifiers based on process variations can only detect cloned, overproduced, and remarked ICs. [ 51,139,140 ] Similarly, hardware metering enables detection of overproduced ICs post‐fabrication, [ 141,142 ] while other approaches like secure split test [ 143 ] and electronic chip ID [ 144 ] detect cloned and defective/out‐of‐spec ICs. Interestingly, none address the issue of recycled ICs.…”
Section: D‐material‐based Watermarking and Anticounterfeitsmentioning
confidence: 99%