Figure 5. Overlapping flakes: a) Schematic representation of the overlapping flakes along with the experimental setup. b) Photo of the overlapping flakes under study with marked regions I, II, and III representing respectively the bottom flake, top flake, and the overlapping region. c) The simulated and measured ratio of the cross-polarized to co-polarized transmittance for regions marked in (b) for flake rotation angle α = 68 ○ . The dashed line represents the case where there is no rotation between the flake axes (α = 0). d) Simulated spectral ellipticity (r) versus α. The green dotted line represents 500 nm data mark. e-g) The simulated and measured polar plots of reflectance as a function of analyzer angle (ϕ a ) when polarizer angle is kept constant at ϕ p = 45° at regions I, II, and III shown in (b) at 500 nm wavelength. The blue dashed line in (e)-(g) illustrates the source characterization at various ϕ a values when ϕ p = 45°. The insets in (e)-(g) are the respective polarization ellipses.