2011
DOI: 10.2109/jcersj2.119.8
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Nano/sub-nano analysis based on high resolution transmission electron microscopy for ceramic materials

Abstract: Grain boundaries, interfaces and surfaces are very attractive areas from the viewpoint of lattice discontinuity. Doped elements and point defects often segregate there, which largely changes bulk properties such as microstructure, mechanical strength, electrical conductivity. To understand the details of the dopant effects, it is necessary to use nano-scale analysis techniques based on transmission electron microscopy with energy dispersive X-ray spectroscopy and electron energy-loss spectroscopy with nano/sub… Show more

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References 62 publications
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