2006
DOI: 10.1063/1.2190899
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Nanolithography by elastomeric scattering mask: An application of photolithographic standing waves

Abstract: An application is demonstrated for the much maligned standing wave in photolithography that is responsible for the sidewall corrugations in photoresist patterns. We demonstrate the realization of a polydimethylsiloxane (PDMS) scattering mask through the casting of these sidewall corrugations and their application as the masking components in an otherwise transparent bulk of PDMS. Photoresist structures with widths in the order of 80nm are realized by the application of this mask, demonstrating excellent correl… Show more

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Cited by 7 publications
(8 citation statements)
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“…For this purpose, the fact was used that wavy substructure features inside the cross section of a single polymerized line arise during a polymerization process in a thin polymer film [40,41]. The reason for this can be explained by interference between the focused laser and the back reflection at the boundary layer of the photosensitive material [38,39]. Thus, the biomimetic systems consist of hierarchically micro-and nanostructure which form a multlayer system (see Figs.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…For this purpose, the fact was used that wavy substructure features inside the cross section of a single polymerized line arise during a polymerization process in a thin polymer film [40,41]. The reason for this can be explained by interference between the focused laser and the back reflection at the boundary layer of the photosensitive material [38,39]. Thus, the biomimetic systems consist of hierarchically micro-and nanostructure which form a multlayer system (see Figs.…”
Section: Resultsmentioning
confidence: 99%
“…Nevertheless, hierarchical microstructure systems can be generated by 2PP using a thin-film of the base material for the polymerization process. In this case, a wavy substructure feature arises inside the cross section of a single polymerized line by the interference between the focused laser and the back reflection at the boundary layer [38][39][40][41]. The size of the wavy substructures depends on the adjusted laser intensity.…”
Section: Fabrication Procedures and Design Of Biomimetic System With Pmentioning
confidence: 99%
“…This slight discrepancy between the model and experiment likely arises as a result of several contributing factors. First, we note the non‐perfect geometry of the actual mask's cross‐section relative to that of the ideal isosceles triangle geometry used to model the system (because of the means of fabrication used, the former is rougher and slightly asymmetric) 55. The largest contribution to the broadened intensity likely results from a slight compression of the tips of the triangular mask upon contact the hard, photoresist‐coated, substrate 56…”
Section: Resultsmentioning
confidence: 99%
“…Some difficulty is encountered in using elastomeric phase masks as a result of their mechanically compliant nature. Smooth vertical walls are required for the modulations of the intensity to decrease to zero at the phase edge [422]. Distortions in the mask, therefore, will broaden the features developed in the photoresist above theoretical limits.…”
Section: Near-field Edge Lithographymentioning
confidence: 99%