Abstract:Atomic force microscopy (AFM) operated in tapping mode was used to simultaneously obtain topographical, phase and loss tangent scans of polypropylene-graphene nanocomposite. This polymer nanocomposite was loaded with five percentage of graphene by weight. AFM force-distance curves were generated to further investigate the elasticity and adhesion of the polymer nanocomposite and to distinguish regions containing graphene or polymer within the nanocomposite. In addition, electrical properties of the nanocomposit… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.