1997
DOI: 10.1002/(sici)1096-9918(199706)25:6<383::aid-sia246>3.3.co;2-j
|View full text |Cite
|
Sign up to set email alerts
|

Nanometer‐scale Elasticity Measurements on Organic Monolayers Using Scanning Force Microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

7
55
0

Year Published

2000
2000
2015
2015

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 32 publications
(62 citation statements)
references
References 0 publications
7
55
0
Order By: Relevance
“…The elastic modulus of the PFTS coating was unknown, but it is expected that the modulus value is in the range of 0.1-1 GPa from the estimated value of similar SAMs. 37 The elastic modulus of Si ͑100͒ is 130 GPa. 38 Therefore the elastic modulus of PFTS is negligible compared to that of silicon.…”
Section: ͑3͒mentioning
confidence: 99%
“…The elastic modulus of the PFTS coating was unknown, but it is expected that the modulus value is in the range of 0.1-1 GPa from the estimated value of similar SAMs. 37 The elastic modulus of Si ͑100͒ is 130 GPa. 38 Therefore the elastic modulus of PFTS is negligible compared to that of silicon.…”
Section: ͑3͒mentioning
confidence: 99%
“…Despite the importance of cuticular mechanical response to the environment, to our knowledge only a single study of cuticular rheology has been performed (Petracek and Bukovac, 1995). With the advent of AFM as a probe of surface nanomechanical behavior (Domke and Radmacher, 1998;Gracias and Somorjai, 1998;Kiridena et al, 1997;Laney et al, 1997;Overney et al, 1994;Radmacher et al, 1992), the effect of environmental or solvent changes on the cuticle's surface rheological behavior can be probed at the nanometer scale. Nanomechanical measurements made by AFM in-volve controlling the force with which the AFM probe is pressed against a sample material.…”
Section: Introductionmentioning
confidence: 99%
“…Kiridena of film and substrate. 92 The result, which contrasts with experience in the macroscopic world, is explained by the fact that modulus measurements via phase shift are sensitive only to the first atom layers. In air, mica is covered with a water film, which is detected by force modulation instead of the mica.…”
Section: Atomic Force Microscopy Tip Adhesion As a Hint To Chemical Mmentioning
confidence: 84%
“…92 A combined instrument with an optical microscope, an LFM instrument and a Vickers nanohardness tester was developed by the Centre Suisse d'Electronique et de Microtechnique (CSEM) in Neuchâtel, Switzerland. 114 The sample is transferred between the three stations with extremely high precision to hit the same area in all three tests.…”
Section: Forces and Mechanical Sample Propertiesmentioning
confidence: 99%