Handbook of Nanoscopy 2012
DOI: 10.1002/9783527641864.ch26
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Cited by 2 publications
(4 citation statements)
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“…The fraction of rutile phase on the TiO 2 crystallites is nearly negligible (Figure S7 in the Supporting Information). Unfortunately, the presence of Fe crystalline phases for the 0.5 and 1.0 wt % Fe-TiO 2 materials was not detected with this technique, even when they were recorded at higher magnifications, since no double-diffraction Moire-like contrasts were found . In contrast, when the high-loaded 7.0 wt % n FeOx-TiO 2 catalyst was analyzed, the presence of very small FeOx NPs could clearly be observed (Figure middle center; see also Figure S8 in the Supporting Information).…”
Section: Results and Discussionmentioning
confidence: 92%
“…The fraction of rutile phase on the TiO 2 crystallites is nearly negligible (Figure S7 in the Supporting Information). Unfortunately, the presence of Fe crystalline phases for the 0.5 and 1.0 wt % Fe-TiO 2 materials was not detected with this technique, even when they were recorded at higher magnifications, since no double-diffraction Moire-like contrasts were found . In contrast, when the high-loaded 7.0 wt % n FeOx-TiO 2 catalyst was analyzed, the presence of very small FeOx NPs could clearly be observed (Figure middle center; see also Figure S8 in the Supporting Information).…”
Section: Results and Discussionmentioning
confidence: 92%
“…Aberration-corrected (S)TEM is now capable of imaging the adsorbents and the possible structure modification at the atomic level; its interpretation needs, however, image simulation and support of DFT calculations. 144 Information Similar to That from Synchrotron Radiation. Synchrotron radiation-based methods are able to explore the fine chemical and structural variation within solid catalysts, also under reaction conditions.…”
Section: Advanced Information That a Modern Tem/stem Can Providementioning
confidence: 99%
“…The active sites of heterogeneous catalysts are often single atoms, clusters, or steps, kinks, or defects on particles. , The high resolution TEM/STEM with aberration corrector can be used to identify the active sites on the extended surface of solid catalyst and their role in reactions. ,,, …”
Section: Role Of Electron Microscopy For the Characterization Of Soli...mentioning
confidence: 99%
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