“…X‐ray photoelectron spectroscopy (XPS) is further used to identify the bonding characteristics and obtain an accurate surface composition of DCC and DCC@MoS 2 /PrNP/CNTs as shown in Figure S6 (Supporting Information). The overall XPS spectrum of DCC reveals the presence of carbon, nitrogen, and sulfur elements in the DCC . The XPS spectrum of DCC@MoS 2 /PrNP/CNTs confirms the existence of elemental C, N, S, Mo, Ba, Mn, Mg, and O with the relative atomic contents of 78%.16%, 0.54%, 9.67%, 3.95%, 1.03%, 0.76%, 0.13%, and 5.75%, respectively.…”