* These authors contribute equally to this work.Photonic circuits can be much faster than their electronic counterparts, but they are difficult to miniaturize below the optical wavelength scale. Nanoscale photonic circuits based on surface plasmon polaritons (SPs) are a promising solution to this problem because they can localize light below the diffraction limit 1-8 . However, there is a general tradeoff between the localization of an SP and the efficiency with which it can be detected with conventional far-field optics. Here we describe a new all-electrical SP detection technique based on the near-field coupling between guided plasmons and a nanowire field-effect transistor. We use our detectors to electrically detect the plasmon emission from an individual colloidal quantum dot coupled to an SP waveguide. The detectors are both nanoscale and highly efficient (0.1 electrons/plasmon), and a plasmonic gating effect can be used to amplify the signal even higher (up to 50 electrons/plasmon). These results enable new on-chip optical sensing applications and fulfill a key requirement for "dark" optoplasmonic nanocircuits in which SPs can be generated, manipulated, and detected without involving far-field radiation.2 SPs are charge-density waves that propagate along metal-dielectric interfaces. They can be concentrated and guided by current carrying wires, suggesting an integrated approach to optical and electrical signal processing. Our near-field plasmon detection scheme consists of an Ag nanowire (NW) crossing a Ge NW field-effect transistor (Fig. 1, Methods). The Ag NW guides 10 SPs to the Ag/Ge junction, where they are converted to electron-hole (e-h) pairs 11-13 and detected as current through the Ge NW. The Ag NWs are highly crystalline and defect-free 8,14,15 , allowing SPs to propagate over distances of several microns without scattering into free-space photons. The Ge NWs are lightly p-doped, covered with a thin native oxide layer, and sensitive to visible light 16 .Electrical plasmon detection is demonstrated by scanning a focused laser beam across an Ag/Ge crossbar device and recording the current (I) through the Ge NW as a function of the diffraction-limited laser spot position. These data, recorded at V b = V gate = 0, show that current flows through the Ge NW only when the laser beam is focused on four distinct spots on the device (Fig. 1b). First, current is detected when the laser is focused near the Ag/Ge junction, due to the direct photoresponse of the Ge NW 16 . The photocurrent induced on the left (I left ) and right (I right ) sides of the junction have opposite signs (discussed below). Moreover, current through the Ge NW (I plas ) is recorded when the laser is focused at either end of the Ag NW.This I plas signal is the key signature for electrical SP detection. Propagating SPs can be launched in the Ag NW only when the excitation laser is incident on the Ag NW ends 15 . Away from the ends, free space photon-to-SP conversion is strongly suppressed by the wave vector mismatch between the two ...