“…1-14.9 at the end of the chapter. (Amigo 2010;Breitkreitz and Poppi 2012;Chen et al 2011;Gendrin et al 2008;Jørgensen et al 2009;Kazarian and Ewing 2013;McIntosh et al 2012;Pavia et al 2001;PratsMontalbán et al 2012;Reich 2005;Van Eerdenbrugh and Taylor 2011;Zeitler et al 2007) Change in frequency of incident electromagnetic radiation due to the absorption or inelastic scattering of a portion resonant to the frequency of molecular, lattice or phonon vibration (stretching, bending, bending, rocking, wagging, scissoring, etc (Carlton 2011;Dieing et al 2011;Eddleston et al 2010;Vitez et al 1998) Interaction of molecular solids with optical/electronic source resulting information on morphology, solid state Polarized light microscopy Identification of solid form based on birefringence and morphology Scanning electron microscopy (SEM) Focused electron beam scanned over the specimen surface under a high vacuum Penetrate the sample interior and the emitted electrons produces the specimen topography Transmission electron microscopy (TEM) Spatial variation of the inelastic interaction of electron beam while transmitting through a sample produces highly resolved image Thermo-gravimetry (TGA; Giron et al 2004) Weight change of the sample as a function of temperature and/or time measured using a sensitive microbalance (Barnes et al 2011;Brown and Vickerman 1984;Chehimi et al 2011;Clark 1977;Harding et al 2007;Ho and Heng 2013;Pollock and Hammiche 2001;Sitterberg et al 2010;Thielmann and Levoguer 2002;Voelkel et al 2009) Atomic force microscopy (AFM) A sharp probe on a flexible cantilever tip (10-20 nm) scanned...…”