2009
DOI: 10.1103/physrevb.79.115422
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Nanoscale electrical properties of cluster-assembled palladium oxide thin films

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Cited by 15 publications
(12 citation statements)
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“…We have used the conductive AFM tip as one of the two electrode of a nanoscale capacitor, the other being the conductive n + doped silicon substrate; the thin IL layer plays the role of the dielectric slab in between the capacitor plates. This is the standard configuration of AFM-based nanoscale impedance and electrostatic force spectroscopy, [78][79][80][81][82] ( r = 3.9) or NaCl ( r = 5.3). Since a similar difference between the values of the dielectric constant obtained by the two approaches is observed also in the case of the test measurements carried out on thermal SiO 2 films (see the Supporting Information, Section S6), we attribute this discrepancy to a systematic error in the fit introduced by the subtraction of a strong interference pattern in the electrostatic force curves (additional information can be found in Supporting Information Figure S8, S9).…”
Section: Dielectric Behavior Of Solid-like [Bmim][ntf2] Layersmentioning
confidence: 99%
“…We have used the conductive AFM tip as one of the two electrode of a nanoscale capacitor, the other being the conductive n + doped silicon substrate; the thin IL layer plays the role of the dielectric slab in between the capacitor plates. This is the standard configuration of AFM-based nanoscale impedance and electrostatic force spectroscopy, [78][79][80][81][82] ( r = 3.9) or NaCl ( r = 5.3). Since a similar difference between the values of the dielectric constant obtained by the two approaches is observed also in the case of the test measurements carried out on thermal SiO 2 films (see the Supporting Information, Section S6), we attribute this discrepancy to a systematic error in the fit introduced by the subtraction of a strong interference pattern in the electrostatic force curves (additional information can be found in Supporting Information Figure S8, S9).…”
Section: Dielectric Behavior Of Solid-like [Bmim][ntf2] Layersmentioning
confidence: 99%
“…Given that the topographic features of the substrate play an essential role, the morphology of the cluster assembled ns‐TiO x may favor the interaction of cells with its surface . Therefore, it is of extreme interest to quantitatively characterize the interaction of this new material with proteins, as this is the basis for controlling cell–surface interactions .…”
Section: Supersonic Cluster Beam Depositionmentioning
confidence: 99%
“…Comparing the performances of the coating with those of the most common commercial substrates in protein and antibody microarray assays, this method demonstrated equivalent efficiency. Through a robust statistical evaluation of repeatability in terms of coefficient of variation analysis, they demonstrate that ns‐TiO x can be used as a reliable substrate for biochips in analytical protein microarray application …”
Section: Supersonic Cluster Beam Depositionmentioning
confidence: 99%
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