2009
DOI: 10.1149/1.3210589
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Nanoscale Investigation of Nafion Membranes after Artificial Degradation

Abstract: In this contribution we report on the nanostructure and conductivity of freshly prepared as well as artificially degraded Nafion membranes investigated by contact atomic force microscopy (AFM), conductive AFM, and pulsed force-mode (PFM)-AFM. The different techniques can provide complementary information on structure and conductivity. Conductive AFM is used to investigate the conductivity of Nafion membrane surfaces. The images show a quite inhomogeneous distribution of current at the surface. The percentage o… Show more

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Cited by 7 publications
(6 citation statements)
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“…For recording quantitative data the magnitude of the different forces and the dissipation energy is calibrated before measurement. This mode has been successfully applied to the investigation of microporous layers (11). For the analysis of polymer samples like Nafion the Peak Force Quantitative Nanomechanical Property Mapping (PeakForce QNM™, Bruker Corp.)) is better suited since it uses standard AFM tips with adjusted spring forces, including conductive tips.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…For recording quantitative data the magnitude of the different forces and the dissipation energy is calibrated before measurement. This mode has been successfully applied to the investigation of microporous layers (11). For the analysis of polymer samples like Nafion the Peak Force Quantitative Nanomechanical Property Mapping (PeakForce QNM™, Bruker Corp.)) is better suited since it uses standard AFM tips with adjusted spring forces, including conductive tips.…”
Section: Methodsmentioning
confidence: 99%
“…In this respect, the degradation of the different fuel cell components can also be investigated. AFM has already been successfully applied to the investigation of microporous layers before and after fuel cell operation (11). A microporous layer is a two-component material which mainly consists of carbon and PTFE.…”
Section: Introductionmentioning
confidence: 99%
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“…With AFM the surface topography as well as different properties such as i.e. conductivity, adhesion force, elasticity, dissipation energy can be measured and statistically analyzed (8)(9)(10).…”
Section: Introductionmentioning
confidence: 99%
“…Atomic force microscopy (AFM) is a versatile tool for the analysis of surface properties and has been shown to be quite valuable for the investigation of components and materials used in PEM fuel cells [1][2][3][4][5][6]. Especially, the novel technique based on fourier synthesis of the force separation curve at every image point deliver material sensitive information (HarmoniX mode by Bruker Corp.).…”
mentioning
confidence: 99%