2011
DOI: 10.1038/nnano.2011.39
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Nanoscale Joule heating, Peltier cooling and current crowding at graphene–metal contacts

Abstract: The performance and scaling of graphene-based electronics is limited by the quality of contacts between the graphene and metal electrodes. However, the nature of graphene-metal contacts remains incompletely understood. Here, we use atomic force microscopy to measure the temperature distributions at the contacts of working graphene transistors with a spatial resolution of ~ 10 nm (refs 5-8), allowing us to identify the presence of Joule heating, current crowding and thermoelectric heating and cooling. Compariso… Show more

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Cited by 296 publications
(268 citation statements)
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“…Consequently, in the case of suspended nanowires the ( , ) reflects the temperature of the nanowires as well as the background temperature of the substrate in-between the wires. In contrast, contact-based vacuum SThM [11][12][13][14][15] would detect only the temperature of the suspended nanowires if scanning at a height corresponding to the top surface plane of the nanowires.…”
Section: S4 Experimental Demonstration Of the Tsot Spatial Resolutionmentioning
confidence: 97%
“…Consequently, in the case of suspended nanowires the ( , ) reflects the temperature of the nanowires as well as the background temperature of the substrate in-between the wires. In contrast, contact-based vacuum SThM [11][12][13][14][15] would detect only the temperature of the suspended nanowires if scanning at a height corresponding to the top surface plane of the nanowires.…”
Section: S4 Experimental Demonstration Of the Tsot Spatial Resolutionmentioning
confidence: 97%
“…The R C dependence on temperature and carrier density is given through its dependence on sheet resistance R S (see Supplement Section C); thus, R C for such GNRs is almost independent of temperature like the mobility, but it scales approximately as the inverse square root of carrier density, ∝ (n + p) -1/2 (also see refs. 27,36). The uncertainty in the R C extraction arises partly from the fitting algorithm (as for mobility) and partly from uncertainty of the GNR width which fans out under the metal contact, taken here between W and W + 2L T where L T is the current transfer length into the contact electrode 36 .…”
Section: Previous Studies Have Characterized Individualmentioning
confidence: 99%
“…The images reveal pitting of the metal at the contact resulting in reduced contact area between the nanowire and electrode. The pitting may be due to current crowding at the leading edge of the metal-nanowire contact region [41]. The localized region of high current density at the leading edge may exacerbate electromigration of the metal electrode.…”
Section: Electrothermal Analysis Of Zinc Oxide Nanowiresmentioning
confidence: 99%