2015
DOI: 10.1063/1.4905507
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Nanoscale-resolved chemical identification of thin organic films using infrared near-field spectroscopy and standard Fourier transform infrared references

Abstract: We establish a solid basis for the interpretation of infrared near-field spectra of thin organic films on highly reflective substrates and provide guidelines for their straightforward comparison to standard far-field Fourier transform infrared (FTIR) spectra. Particularly, we study the spectral behavior of near-field absorption and near-field phase, both quantities signifying the presence of a molecular resonance. We demonstrate that the near-field phase spectra only weakly depend on the film thickness and can… Show more

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Cited by 106 publications
(108 citation statements)
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“…For relatively thick samples, it is generally accepted that the absorption is proportional to the imaginary component of the scattered field, A sin φ, 22,23 where A is the optical amplitude and φ is the local phase difference relative to the incident field. The aNSOM is configured as a pseudoheterodyne Michelson interferometer in order to extract the optical phase.…”
mentioning
confidence: 99%
“…For relatively thick samples, it is generally accepted that the absorption is proportional to the imaginary component of the scattered field, A sin φ, 22,23 where A is the optical amplitude and φ is the local phase difference relative to the incident field. The aNSOM is configured as a pseudoheterodyne Michelson interferometer in order to extract the optical phase.…”
mentioning
confidence: 99%
“…For an SiO 2 film on Si, calculations that approximate the tip as a spheroid of length 2L and radius r (r ) are often used to quantify the relative amounts of chemical species in a mixture via multivariate analysis. Although experimental validation on heterogeneous samples is needed, significant progress in relating s-SNOM spectra with far-field FTIR spectra was recently accomplished through analyses of the amplitude (A), phase, and absorption (A abs = |A|sinΦ) signals as a function of thickness in PMMA films on highly reflective substrates (Si) (102). Peak intensities in the phase spectra increased with thickness, and their positions (blue-shifted by ≈3 and 9 cm −1 with respect to far-field grazing angle and transmission spectra, respectively) are mostly insensitive to the thickness.…”
Section: Scattering Scanning Near-field Optical Microscopymentioning
confidence: 99%
“…All spectral data had a zero-fill factor of 4, so that the final spectra were saved at a nominal spectral resolution of 2.1 cm -1 . Please do not adjust margins Please do not adjust margins spatial resolution from the complex-valued second order scattering coefficient, (σ 2 ), [26][27][28] given by equation 1:…”
Section: Sins Spectral Collectionmentioning
confidence: 99%