Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy

Polaritons in 2D materials exhibit extensive optical phenomena, such as an ultrahigh field confinement and tunability and, thus, have been attracting increasing attentions. Many different methods have been developed to characterize and manipulate polaritons, which in turn has promoted a steady booming of this field. Here, the significant progress made in probing polaritons in 2D materials based on the characterization method, i.e., optical far‐field, optical near‐field, and (opto)electronic methods is reviewed. Perspectives on the potential development and applications of these methods are also discussed.

Section: Far‐field Optical Methodsmentioning

confidence: 99%

Probing Polaritons in 2D Materials

Luo

Guo

et al. 2020

“…At the end of this section, we remark that, in addition to detecting polariton standing waves from scattering field off the s‐SNOM tip, the s‐SNOM setup can be implemented with photocurrent, photoinduced force or peak force setup, as photon‐free imaging schemes for polariton waves.…”

Section: From Plasmonics To Polaritonicsmentioning

confidence: 99%

Phonon Polaritons and Hyperbolic Response in van der Waals Materials

Shen

Qiu

et al. 2019

113

Phonon polaritons provide useful opportunities, complementary to those provided by plasmon polaritons, in the study of the interaction of light with matter at small scales. The focus of this review is on phonon polaritons in low‐dimensional van der Waals (vdW) materials and heterostructures. Phonon polaritons confined in vdW materials exhibit large electromagnetic localization and are easy to hybridize with other collective modes. The extreme optical anisotropy in vdW systems produces the natural hyperbolic dispersion, enabling the access to deep subdiffractional optics and often yielding improved figures of merit over hyperbolic metamaterials. These virtues hold promises for practical nanophotonic applications, including optical sensing, super‐resolution imaging, energy and emission engineering, quantum optics, and a next generation of optical circuit elements.

“…Recently‐developed peak force infrared (PFIR) microscopy is a new type of photothermal AFM‐IR microscopy that overcomes the limitation of the contact mode PTIR microscopy . PFIR microscopy operates in the peak force tapping mode that can avoid sample damage.…”

mentioning

confidence: 99%

“…PFIR microscopy operates in the peak force tapping mode that can avoid sample damage. This method has been demonstrated on a variety of samples to provide spectroscopic imaging with a spatial resolution as high as 6 nm, as well as complimentary nano‐mechanical information …”

mentioning

confidence: 99%

See 1 more Smart Citation

Revealing Phonon Polaritons in Hexagonal Boron Nitride by Multipulse Peak Force Infrared Microscopy

Wang

Wagner

Wang

et al. 2019

Self Cite

Probing of polaritons in 2D materials is facilitated by spectroscopic imaging with nanometer spatial resolution. The combination of atomic force microscopy and infrared laser sources provides access for in situ mappings of phonon polaritons. Here, it is demonstrated that the photothermal‐based peak force infrared microscopy is capable of revealing phonon polaritons with high spatial resolution in isotopically pure hexagonal boron nitride microstructures without damaging the sample. To further improve the sensitivity, peak force infrared microscopy is enhanced with a scheme of multiple laser pulse excitation. The resulting method of multipulse peak force infrared microscopy can detect phonon polaritons with high sensitivity, which is particularly useful for probing polaritons in 2D materials with high damping characteristics.