2021
DOI: 10.1021/acsanm.1c02034
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Nanoscale Thermoelasticity in Silicon Nitride Membranes: Implications for Thermal Management

Abstract: The characterization of thermal and elastic properties at the nanometer length scale is fundamental for the implementation of materials in nanotechnology. Here, we show how four-wave mixing of extreme ultraviolet ultrashort pulses allows for high-precision measurements of nanoscale elasticity in thin suspended silicon nitride membranes through the generation and detection of Lamb waves at 10's of nm wavelengths. Our approach is contact-free and nondestructive, and it provides an estimate of both shear and long… Show more

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Cited by 9 publications
(11 citation statements)
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“…Fig. 7 displays representative EUV TG data collected in the forward diffraction geometry from different samples, namely: amorphous Si 3 N 4 (panels (a) and (b) [4] , [14] ), amorphous metallic alloy Zr 65 Cu 27.5 Al 7.5 (panels (c) and (d)) and crystalline atomic metal Co (panel (e)); the last two samples were grown on a thin Si 3 N 4 membrane. The total thickness of all samples was sufficiently small (< 150 nm) to permit transmission of the signal beam.…”
Section: Resultsmentioning
confidence: 99%
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“…Fig. 7 displays representative EUV TG data collected in the forward diffraction geometry from different samples, namely: amorphous Si 3 N 4 (panels (a) and (b) [4] , [14] ), amorphous metallic alloy Zr 65 Cu 27.5 Al 7.5 (panels (c) and (d)) and crystalline atomic metal Co (panel (e)); the last two samples were grown on a thin Si 3 N 4 membrane. The total thickness of all samples was sufficiently small (< 150 nm) to permit transmission of the signal beam.…”
Section: Resultsmentioning
confidence: 99%
“…
Fig. 7 Circles connected by lines are the EUV TG signal in forward diffraction as a function of Δt for amorphous Si 3 N 4 at 28 nm (panel (a)) and at 84 nm (panel (b)) [4] , [14] , Zr 65 Cu 27.5 Al 7.5 at 24 nm (panel (c)) and at 84 nm (panel (d)), and Co at 44 (panel (e)). The inset in the latter panel shows, in a semi logarithmic scale, the signal waveform on a longer range in Δt; we vertically offset by a factor 10 −9 to fit in the logarithmic vertical scale.
…”
Section: Resultsmentioning
confidence: 99%
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