“…From this mapping the local potential properties, such as electric field distribution due to dynamic carriers, in the semiconductor device is acquired without destroying the operating device (Ban et al ., ; Ban et al ., ,b; Dhar et al ., ,b). SVM has been successfully used to image the quantum structures on the nanometer scale device and also to resolve and measure inner workings such as voltage profiles, electric fields and their carrier distribution and in some instances also estimate the dynamic carrier concentration in operating III–V material‐based nanodevices (Ban et al ., ,b; Dhar et al ., ,b; Dhar et al ., ). Due to high spatial resolution of the AFM probe, SVM measurement resolved the structural layers accurately from the voltage profiling of the mapped image.…”