Nanostructure characterization of Co–Pd–Si–O soft magnetic nanogranular film using small-angle X-ray and neutronscattering

Abstract

The nanostructure of a Co-Pd-Si-O nanogranular film was investigated with the combined use of small-angle x-ray (SAXS) and neutron scattering (SANS). Using a new, compact type of SANS instrument, the SANS profiles of individual particles with a diameter of about 2-4 nm were successfully observed. The structures of magnetic regions were found to be the same as the chemical structures of the particles, and a sharp interface was observed between the matrix and the particles. The SAXS to SANS ratio clearly indicates that the particles are a CoPd alloy and the matrix is not pure SiO 2. In fact, the matrix is composed of a meaningful amount of Co.

Temperature dependence of nanostructure in PbSe–ZnSe composite thin film

“…All the profiles show a plateau at the lowest q (roughly q < 0.5 nm -1 ), and the profiles at the 5 higher q range decreased in proportion to q -4 . Similar behaviour is observed in the scattering of spherical particles, confirming the formation of nanoparticles in the samples [12,13]. The interesting point is that with increasing T sub , a peculiar change the SAXS profile occurs.…”

“…These characteristics are useful for investigating the growth process and improving the preparation conditions of the nanoparticles. There are not a few reports about the qualitative characterization of nanoparticles such as quantum dots in composite thin films using SAXS [9,[11][12][13]. Therefore, in this study, the nanostructure of the PbSe-ZnSe composite thin films was quantitatively investigated using SAXS.…”