2018
DOI: 10.1116/1.5020966
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Native oxide removal from Ge surfaces by hydrogen plasma

Abstract: The mechanisms to remove the native oxide layer on Ge(001) surfaces by an in situ hydrogen plasma inside an atomic layer deposition (ALD) reactor has been studied. A strong dependence of the reaction mechanism in the temperature range commonly employed by ALD has been identified through the combined analysis of atomic force microscopy, x-ray photoelectron and Raman spectroscopy. At low temperatures (e.g., 110 °C), the hydrogen plasma removed both Ge and O species from the native GeO2 layer, but also induced su… Show more

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Cited by 2 publications
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“…2). The chemical reaction equation between Ge oxide and hydrogen ions at low temperature is shown as follows: 28…”
Section: Resultsmentioning
confidence: 99%
“…2). The chemical reaction equation between Ge oxide and hydrogen ions at low temperature is shown as follows: 28…”
Section: Resultsmentioning
confidence: 99%
“…The high-resolution XP spectrum of the Ge 3d region (Fig. S29a, ESI †) showed the presence of Ge 1+ (binding energy at 30.3 eV) and Ge 4+ (binding energy at 32.5 eV) species, 33 indicating that after the removal of the native oxide, the surface Ge undergoes hydrolysis in the water forming Ge-H and Ge-OH on the surface. The generated Ge-H simultaneously reduced the metal ions, resulting in the deposition of the HEA NPs, which is consistent with the SEM images where no obvious local etching was observed.…”
Section: Synthesis Of Hea Nps By Bulk Gementioning
confidence: 99%