2015
DOI: 10.1016/j.icheatmasstransfer.2015.05.016
|View full text |Cite
|
Sign up to set email alerts
|

Natural convection on inclined QFN32 electronic package generating constant volumetric heat flux

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2015
2015
2018
2018

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 13 publications
(2 citation statements)
references
References 18 publications
0
2
0
Order By: Relevance
“…This condition is difficult to achieve when the assembly is subject to natural convection given the weak convective heat transfer coefficients concerning the free areas of the QFN (top and sides). This is clearly shown by Baïri (2015a, 2016a) for the QFN16 model, by Baïri (2015b) and Baïri and Haddad (2016) for the QFN32, by Baïri (2015c, 2016b) for the wire bonded versions 16b and 32b, respectively, and by Baïri et al (2017) for the QFN64. These works are valid in wide ranges of the generated power up to 1W and for devices tilted between horizontal and vertical positions.…”
Section: Introductionmentioning
confidence: 81%
“…This condition is difficult to achieve when the assembly is subject to natural convection given the weak convective heat transfer coefficients concerning the free areas of the QFN (top and sides). This is clearly shown by Baïri (2015a, 2016a) for the QFN16 model, by Baïri (2015b) and Baïri and Haddad (2016) for the QFN32, by Baïri (2015c, 2016b) for the wire bonded versions 16b and 32b, respectively, and by Baïri et al (2017) for the QFN64. These works are valid in wide ranges of the generated power up to 1W and for devices tilted between horizontal and vertical positions.…”
Section: Introductionmentioning
confidence: 81%
“…6,7 This approach, however, provides only the information about the average expected lifetime for a specific working condition without providing any indication about the ongoing failure mechanism and, as a consequence, without providing directions to improve reliability. Numerical modeling can be applied to evaluate thermal field in electronic components 8 or to evaluate how a given thermal input determines deformations and stress concentration on the component as well as at the wire-to-chip interface. 9 However, it should be underlined that due to the high complexity of the modern electronic components and devices, many input data are required in order to have an accurate model or, as an alternative, several approximations have to be done that can affect the final accuracy of the simulation.…”
Section: Introductionmentioning
confidence: 99%