2001
DOI: 10.1109/77.919286
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NbN multilayer technology on R-plane sapphire

Abstract: A new NbN multilayer technology has been developed on 3 inch diameter R-plane sapphire substrates, for combining on-chip fast RSFQ circuits with GHz bandwidth optical links. The circuits take advantage of two high quality (110) NbN layers sputtered epitaxially on sapphire at 600°C and selectively patterned: a 400 nm thick layer (LL-250 nm at 6K) acts for the ground-plane and microbridge photodetectors are made of a 3.5-8 nm thick NbN epilayer with T, above 11 K. Innovative dielectrics formed of 10 nm thick MgO… Show more

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Cited by 42 publications
(24 citation statements)
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“…For films with an intended thickness of 3.5 nm ͑not directly measured͒, the highest superconducting transition temperatures ͑T c ͒ are reported to be 9.5-11 K. 9 Among them, NbN films on MgO, MgO buffer layers and sapphire substrates have higher T c than NbN films on Si substrates. These substrates allow for epitaxial growth of the NbN films, [8][9][10] resulting in a monocrystalline structure. For HEB mixers, Si is a preferred substrate because of its low loss at terahertz frequencies, well-established processing technology, and inherent reliability.…”
mentioning
confidence: 99%
“…For films with an intended thickness of 3.5 nm ͑not directly measured͒, the highest superconducting transition temperatures ͑T c ͒ are reported to be 9.5-11 K. 9 Among them, NbN films on MgO, MgO buffer layers and sapphire substrates have higher T c than NbN films on Si substrates. These substrates allow for epitaxial growth of the NbN films, [8][9][10] resulting in a monocrystalline structure. For HEB mixers, Si is a preferred substrate because of its low loss at terahertz frequencies, well-established processing technology, and inherent reliability.…”
mentioning
confidence: 99%
“…We find that the resistivity ratio, which is smaller than 1, decreases almost linearly from 0.98 to 0.89 as N 2 flow rate is increased from 1.4 sccm to 2.9 sccm. This kind of temperature dependence is commonly observed in polycrystalline NbN films [1][2][3][4][5][6][7][8][9] and often interpreted as grain-boundary scattering effect [3,4]. T c and normal state resistivity for all the NbN thin films studied in this work are summarized in Fig.…”
Section: Resultsmentioning
confidence: 90%
“…To obtain high T c of around 16 K, NbN films were often deposited at elevated temperatures of around 300°C [7][8]. However, in the case of multilayers such as spin-switch devices, multilayers grown at elevated temperatures can be vulnerable to alloying of two different materials at interfaces.…”
Section: Introductionmentioning
confidence: 99%
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“…NbN films were grown at CEA-DRFMC by DC magnetron sputtering of a Nb target in a Ar/N 2 plasma [10]. Very thin films were deposited at 600 °C substrate temperature and passivated by an AlN layer in-situ deposited at room temperature [11].…”
Section: Methodsmentioning
confidence: 99%