Quantum Optics of Confined Systems 1996
DOI: 10.1007/978-94-009-1657-9_9
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Near Field Optics and Scanning Near Field Optical Microscopy

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Cited by 3 publications
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“…Ideally, one would like to combine the high resolution of these techniques with the sensitivity, specificity, and flexibility afforded by optical techniques. This goal has driven the development of near-field scanning optical microscopy (NSOM or SNOM) which can be used to conduct optical measurements with a spatial resolution beyond the classical diffraction limit. …”
Section: Introductionmentioning
confidence: 99%
“…Ideally, one would like to combine the high resolution of these techniques with the sensitivity, specificity, and flexibility afforded by optical techniques. This goal has driven the development of near-field scanning optical microscopy (NSOM or SNOM) which can be used to conduct optical measurements with a spatial resolution beyond the classical diffraction limit. …”
Section: Introductionmentioning
confidence: 99%
“…The near-field scanning optical microscope (NSOM) (Pohl et al, 1984;Lewis et al, 1984) provides lateral resolutions superior to all other optical (far field) microscopes, i.e. in the range of a few nanometres (Betzig et al, 1993;Zenhausern et al, 1995;Fischer et al, 1996). The classical Rayleigh diffraction limit of approximately half the wavelength (l/2) is surpassed by scanning a small tip (typically a micropipette (Harootunian et al, 1986) or an optical fibre (Betzig et al, 1991) drawn down to a diameter <100 nm) in the proximity of the sample surface.…”
Section: Introductionmentioning
confidence: 99%