2007
DOI: 10.1143/jjap.46.238
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Near-Field Optics Imaging in Silica Waveguide Using Near-Field Scanning Optical Microscope

Abstract: A dramatic drop of ≈5 orders of magnitude in the resistance (R) of La 0.175 Pr 0.45 Ca 0.375 MnO 3 epitaxial films upon exposure to optical photons derived from both continuous and pulsed lasers, as well as broad-band sources at temperatures (T ) < 30 K is reported. The strength of change is a sensitive function of both the incident photon flux and temperature. Under isothermal conditions the photo-generated low resistance state persists eternally after removal of light. This non-equilibrium state is metallic,… Show more

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Cited by 4 publications
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