Near-field Raman spectroscopy of semiconductor heterostructures and CVD-diamond layers

Goetz, M.J.; Drews, D.; Zahn, Dietrich R. T.; Wannemacher, Reinhold

doi:10.1016/s0022-2313(97)00217-2

Cited by 17 publications

(15 citation statements)

References 12 publications

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“…It allows the determination of sample composition, chemical bonding, material structure, phase and induced stress. In fact, near-field Raman spectroscopy has been used to study localized stress, 8 local chemical composition 9,10 and local material composition, 11 to name but a few applications. Nano-Raman, as far-field Raman spectroscopy, is advantageous in that it can be performed under ambient conditions.…”

Section: Introductionmentioning

confidence: 99%

The electric field at the apex of a near‐field probe: implications for nano‐Raman spectroscopy

Hallén

Jahncke

2003

J Raman Spectroscopy

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Near-field or nano-Raman spectroscopy is different from its far-field counterpart in several important respects. We present a unified view of nano-Raman spectroscopy that accounts for these differences, which include surface enhancement, propagation differences, the presence of z-polarized light, and electric field gradients that give rise to new spectroscopic selection rules. We also discuss some of the recent advances in near-field scanning optical microscopy (NSOM) and their positive impact on nano-Raman spectroscopy. In particular, progress has been made in fabricating better probes, both apertured and apertureless, for NSOM, resulting in larger signal levels important for Raman spectroscopy. Larger signals result in shorter imaging times, the ability to achieve higher resolution and broader applicability of the technique.

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Section: Introductionmentioning

confidence: 99%

The electric field at the apex of a near‐field probe: implications for nano‐Raman spectroscopy

Hallén

Jahncke

2003

J Raman Spectroscopy

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“…In fact, even for a pure sample, such as diamond thin film, at least 1 min is needed to collect a Raman spectrum at one sampling point. 66 3.3.3. Signal Strength in Tip-Enhanced Raman Spectroscopy.…”

Section: The Signal Strength In Near-field Raman Spectroscopymentioning

confidence: 99%

“…In the past decades, AT-NFRS has been successfully used to characterize chemical and optical properties of many inorganic materials, such as the potassium titanyl phosphate (KTP) crystal, 72 Si/SiO 2 -based samples, 20,73−75 and diamond. 51,66,76 The first AT-NFRS measurement was performed on Rbdoped KTP crystal, a widely used nonlinear optical material, by Jahncke et al using Al-coated tapered optical fibers. 72 With its strong Raman response and doping tunability, KTP crystal was considered an excellent candidate for nano-Raman investigations.…”

Section: Application Of Near-field Raman Spectroscopymentioning

confidence: 99%

Near-Field Raman Spectroscopy with Aperture Tips

2016

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In this paper, we review nano-Raman techniques based on aperture scanning near-field optical microscopy (SNOM). Fundamentals of SNOM and aperture-tip-based near-field Raman spectroscopy and their applications in key technical issues, including Raman signal intensity and collection time, are introduced. Recent advances in the tip design are discussed, and applications of the aperture-SNOM-based nano-Raman technique are presented. We attempt to identify the most pressing open questions in this field. We believe that, by improving the power transmission efficiency and combining the local field enhancing technique with the tip-enhanced spectroscopy, the performance of aperture-SNOM can be significantly improved. Its nanometer-scale excitation volume and the consequent low background make the aperture-tip technique feasible for many important samples that cannot be measured by other optical nanospectroscopies.

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“…Several research groups have developed techniques that combine conventional spectroscopies with NSOM. Contrast mechanisms that rely on vibrational spectroscopy (infrared absorption [6][7][8][9][10][11][12][13][14] and Raman [15][16][17][18][19][20][21][22] spectroscopies), dielectric spectroscopy (microwave dispersion), [23][24][25][26][27] and nonlinear spectroscopy [28][29][30] have all been demonstrated at length scales below the diffraction limit of light. In this present study, we explore the application of broadband, near-eld infrared (IR) spectroscopy and microscopy as a tool for the characterization of spatial variations in chemical composition in a th in lm p oly sty re n e/poly(ethy l acr ylate) (P S/P EA ) blend.…”

Section: Introductionmentioning

confidence: 99%

Near-Field Infrared Imaging and Spectroscopy of a Thin Film Polystyrene/Poly(Ethyl Acrylate) Blend

Michaels

Chase

et al. 2004

Appl Spectrosc

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The application of broadband, near-field infrared microscopy to the characterization of the mesoscale structure of a thin film polymer blend is described. Key features of this instrument, which couples the nanoscale spatial resolution of scanning probe microscopy with the chemical specificity of vibrational spectroscopy, include broad tunability and bandwidth, parallel spectral detection for high image acquisition rates, and infrared-transparent aperture probes. Nearfield spectral transmission images of a thin film of polystyrene/poly(ethyl acrylate) acquired in the C-H stretching region are reported. An assessment of the relative importance of transmission image contrast mechanisms is a significant aim of this work. Analysis of the near-field infrared spectra indicates that the image contrast in the C-H stretching region is largely due to near-field coupling and/or scattering effects. Identification and differentiation of the operative contrast mechanisms on the basis of their relative dependence on wavelength is discussed. Analysis of the contrast attributed to absorption is consistent with the chemical morphology of this sample derived from previous chemical modification/atomic force microscopy studies.

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Near-field Raman spectroscopy of semiconductor heterostructures and CVD-diamond layers

Cited by 17 publications

References 12 publications

The electric field at the apex of a near‐field probe: implications for nano‐Raman spectroscopy

The electric field at the apex of a near‐field probe: implications for nano‐Raman spectroscopy

Near-Field Raman Spectroscopy with Aperture Tips

Near-Field Infrared Imaging and Spectroscopy of a Thin Film Polystyrene/Poly(Ethyl Acrylate) Blend

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