2006
DOI: 10.1255/jnirs.586
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Near Infrared Spectroscopy, Cluster and Multivariate Analysis—Characterisation of Silica Materials for Liquid Chromatography

Abstract: Near infrared (NIR) refl ectance spectroscopy is a well established method within the analytical chemistry and a wide range of applications, for example in the fi eld of food and pharmaceutical products, is covered. In the era of material science and nano technology, we brought together, in this feasibility study, silica chemistry with NIR. NIR, in the fi bre-optics mode, is used for morphological studies. It enables differentiation between silica materials in a three-dimensional factor-plot depending on their… Show more

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Cited by 21 publications
(24 citation statements)
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“…Differences in pore structure can be visualised by SEM. Figure 1 shows electron micrographs of nonporous, 60, 300 and 1000 silica particles [43]. Spectra are recorded in the wavenumber range from 4500 to 9996 cm -1 following the Kubelka -Munk function (f(R) = (1 -R) 2 /2R; R = I/I 0 ) [44].…”
Section: Silica Materialsmentioning
confidence: 99%
“…Differences in pore structure can be visualised by SEM. Figure 1 shows electron micrographs of nonporous, 60, 300 and 1000 silica particles [43]. Spectra are recorded in the wavenumber range from 4500 to 9996 cm -1 following the Kubelka -Munk function (f(R) = (1 -R) 2 /2R; R = I/I 0 ) [44].…”
Section: Silica Materialsmentioning
confidence: 99%
“…As a selected example the 2D-cluster depicted in Fig. 2 allows the classification of pure silica, silica-C18 and aminosilica [18]. The sensitivity to differentiate between different particle sizes at consistent porosity and the sensitivity to differentiate between different porosities at consistent particle size were verified successfully in a detailed study described in [19].…”
Section: Silica Materialsmentioning
confidence: 87%
“…A quantitative approach enables the determination of surface coverage [20] as well as particle size, specific surface area and pore structure simultaneously [18,19]. Particle size is routinely determined by electron microscopy, light scattering or the Coulter-Counter (CC) method.…”
Section: Silica Materialsmentioning
confidence: 99%
“…This quality index qualifies the calibrations using a number between 0 (useless) and 1 (ideal). When achieving a Q-value greater than 0.50, the calibration will give reliable results [28]. Outlier detection was performed by the software based on Mahalanobis distance criterion [29].…”
Section: Methodsmentioning
confidence: 99%