2016
DOI: 10.1002/pssb.201600473
|View full text |Cite
|
Sign up to set email alerts
|

Near surface latent track morphology of SHI irradiated TiO2

Abstract: The material response to SHI irradiation of simple oxides such as TiO 2 is markedly different in the near surface volume than in the bulk. In this subsurface region, several tens of nanometers in thickness, the material exhibits a much higher sensitivity to damage creation. The enhanced sensitivity of the material in this region is related to the proximity of a free surface and not strongly dependent on electronic stopping power. At least for these materials, the assumption of cylindrical latent tracks is dubi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

2
19
0

Year Published

2019
2019
2025
2025

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 24 publications
(21 citation statements)
references
References 14 publications
2
19
0
Order By: Relevance
“…The above model that TiO 2 sample is amorphized only inside the ion -track, and the amorphized region never contributes to the XRD diffraction seems to be too simple. The previous TEM (transmission electron microscope) observations, however, clearly show that just inside the ion-track in TiO 2 , the structure becomes amorphous, and outside the iontrack, the crystal structure is maintained [26,27]. The XRD peaks for TiO 2 samples which are almost completely amorphized by high energy heavy ion irradiation are much smaller than for the unirradiated crystalline TiO 2 and are scarcely observed [22].…”
Section: Results Of the Monte Carlo Simulation And The Analysis Using The Poisson Distribution Function 41 Amorphization Of Tio 2 By Highmentioning
confidence: 83%
“…The above model that TiO 2 sample is amorphized only inside the ion -track, and the amorphized region never contributes to the XRD diffraction seems to be too simple. The previous TEM (transmission electron microscope) observations, however, clearly show that just inside the ion-track in TiO 2 , the structure becomes amorphous, and outside the iontrack, the crystal structure is maintained [26,27]. The XRD peaks for TiO 2 samples which are almost completely amorphized by high energy heavy ion irradiation are much smaller than for the unirradiated crystalline TiO 2 and are scarcely observed [22].…”
Section: Results Of the Monte Carlo Simulation And The Analysis Using The Poisson Distribution Function 41 Amorphization Of Tio 2 By Highmentioning
confidence: 83%
“…Indirect methods such as the Rutherford backscattering in channelling configuration (RBS-C) can infer "effective" diameters by assuming the total measured disorder in the probed layer is the sum of identical cylindrical tracks but this assumption is clearly not valid for these materials. Also, it has been shown previously that the near surface regions of these materials exhibit significantly different track morphology than in the bulk [14].…”
Section: Methodsmentioning
confidence: 89%
“…However, this model cannot explain why track morphology changes from an cylinder to a cone as a function of ion path length in the same thickness of thin sample as shown in Fig. 2a 21,24 , as they are all defined as non-amorphizable materials (or "resistant materials" in some literature) 30,59,60 .…”
Section: What Are Responsible For Sandglass Morphology Of Ion Tracks?mentioning
confidence: 99%
“…A reduced internal pressure near surface of rutile has been suggested to be responsible for the formation of conical morphology of ion track 24 . However, this model cannot explain why track morphology changes from an cylinder to a cone as a function of ion path length in the same thickness of thin sample as shown in Fig.…”
Section: What Are Responsible For Sandglass Morphology Of Ion Tracks?mentioning
confidence: 99%
See 1 more Smart Citation