GaN‐based light‐emitting diodes (LEDs) were fabricated on nanopatterned sapphire substrates (nano‐PSSs) by thermal lithography with laser irradiation. The characteristics of the LEDs were measured by X‐ray diffraction analysis and scanning electron microscopy. The crystalline qualities of the LEDs deteriorated with the shortening of the nanopattern periods. The nucleation of GaN was initiated from the nanopatterns, which increased the number of grain boundaries. The output power of the LEDs on the nano‐PSSs with a diameter of 200 nm and 500 nm periods was 70% higher than that on flat sapphire substrate. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)