2012
DOI: 10.1016/j.phpro.2012.03.057
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Nearly Dislocation-free Ge/Si Heterostructures by Using Nanoscale Epitaxial Growth Method

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Cited by 3 publications
(2 citation statements)
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“…Thanks for thin thickness of the Ge stripe, partial lattice mismatch could be released in the Ge-SiO 2 interface, which could avoid too many defects. 20,21 In other words, to obtain MDs-free GOI by RMG, the Si concentration gradient of the Ge stripe in the growth region should be lower than 3.5%. This 0.24% compressive strain seem to be a residual strain.…”
Section: Resultsmentioning
confidence: 99%
“…Thanks for thin thickness of the Ge stripe, partial lattice mismatch could be released in the Ge-SiO 2 interface, which could avoid too many defects. 20,21 In other words, to obtain MDs-free GOI by RMG, the Si concentration gradient of the Ge stripe in the growth region should be lower than 3.5%. This 0.24% compressive strain seem to be a residual strain.…”
Section: Resultsmentioning
confidence: 99%
“…There are two general methods for the QDs preparation, which are displayed in the last decade: (1) the nano-size formation of semiconductor particles using colloidal chemistry [40], (2) the epitaxial growth and/or nano-scale patterning is used [41], i.e. Utilizing lithography-established technology [42].…”
Section: Synthesis Of Only Core In Quantum Dotsmentioning
confidence: 99%