2015
DOI: 10.1016/j.spmi.2014.12.019
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Negative differential resistance in porous silicon devices at room temperature

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Cited by 21 publications
(3 citation statements)
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“…The negative differential resistance properties are observed on various materials with different morphology such as ZnO nanorod, porous silicon devices and graphene nanoribbon FET [38,64,65]. The NDR property of NiFe 2 O 4 nanowire device is similar to the reported works, which further strengthens the present work.…”
Section: -9supporting
confidence: 89%
“…The negative differential resistance properties are observed on various materials with different morphology such as ZnO nanorod, porous silicon devices and graphene nanoribbon FET [38,64,65]. The NDR property of NiFe 2 O 4 nanowire device is similar to the reported works, which further strengthens the present work.…”
Section: -9supporting
confidence: 89%
“…A symmetrical curve is observed during the second part of the voltage cycle with V p1′ and V p2′ , which are equal to −20 and −17 V for the first sweep and −24 and −19 V for the second sweep. Similar differential negative resistances were observed in porous silicon with V p1 = 7.5 V, V p2 = 6.0 V, and V stop = 20 V. Additionally, multilevel unipolar resistive switching was measured in the Ag/SiO 2 /Pt structure with V p1 = −0.6 V and V stop between −1 and −4 V.…”
Section: Resultssupporting
confidence: 71%
“…Then, the data are denoised with a digital wavelet transform . As seen in Figure , different memristive behavior is observed compared to that in the high resistance regime, and a negative differential resistance is observed. Additionally, between +5 and −5 V, diode-like behavior is noticed; further studies with a smaller voltage step would be needed to draw a conclusion on this phenomenon.…”
Section: Resultsmentioning
confidence: 99%