The resistivity of the anisotropic semiconductor p-CdSb is investigated in a wide temperature range of T = 1.9-300 K in pulsed magnetic fields up to B = 25 T. Two not intentionally doped single-crystalline samples oriented along the crystallographic axes [100] (no. 1) and [010] (no. 2) are used for measurements of the resistivity, ρ, in transversal magnetic field configuration. Below T ≈ 8 K the resistivity follows the laws ln ρ ∼ C B 2 for B < B c and ln ρ ∼ S B 7/12 for B > B c , where the coefficients C and S do not depend on T , and B c ≈ 5-7.5 T. These are characteristics of nearest-neighbour hopping conductivity. The coefficients C and S depend on the direction of B, and their ratios agree completely with the values calculated with the components of the hole effective mass. The acceptor concentrations, N 1 ≈ 4.3 × 10 16 cm −3 and N 2 ≈ 7.6 × 10 16 cm −3 for no. 1 and no. 2, respectively, are relatively close to the critical value of the metal-insulator transition (MIT), N c ≈ 1.2×10 17 cm −3 . This leads to enhancement of the mean localization radii, a * 1 ≈ 78 Å in no. 1 and a * 2 ≈ 126 Å in no. 2, with respect to the value of a * 0 ≈ 50 Å far from the MIT determined by an asymptote of the wavefunction at a large distance from the impurity centre.