2023 7th IEEE Electron Devices Technology &Amp; Manufacturing Conference (EDTM) 2023
DOI: 10.1109/edtm55494.2023.10102952
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Negative-Thermal-Expansion Gate Electrode to Introduce Tensile Strain into the Channel of MOSFETs for Mobility Enhancement

Hisashi Kino
1
,
Takafumi Fukushima
2
,
Tetsu Tanaka
3
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