Abstract:Integrated circuit technology has been dramatically developed during the past decades. Reliability of analog circuits becomes more and more important for yield design. However, most state of the art researches are concentrated on analog circuit robust optimization and analog circuit fault detection. There are seldom any researches on analog circuit fault-tolerant design. This paper proposed an negativelycorrelated evolution strategy to design fault-tolerant analog circuits. In the proposed strategy, the fault-… Show more
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