2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC) 2019
DOI: 10.1109/vlsi-soc.2019.8920291
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Netlist Optimization by Gate Merging

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Cited by 2 publications
(2 citation statements)
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“…Eight different error metrics, including mean absolute error (MAE), error probability (EP), standard deviation (STD), mean relative error (MRE), median of absolute error (MeAE), mode of absolute error (MoAE), maximum absolute error (Max-AE), and minimum absolute error (Min-AE) were investigated for eVar, and BwF-modified CGP and traditional CGP configurations for the power and activation functions. The error metrics are defined in Equation (6).…”
Section: Resultsmentioning
confidence: 99%
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“…Eight different error metrics, including mean absolute error (MAE), error probability (EP), standard deviation (STD), mean relative error (MRE), median of absolute error (MeAE), mode of absolute error (MoAE), maximum absolute error (Max-AE), and minimum absolute error (Min-AE) were investigated for eVar, and BwF-modified CGP and traditional CGP configurations for the power and activation functions. The error metrics are defined in Equation (6).…”
Section: Resultsmentioning
confidence: 99%
“…The standard rule-based and top-down synthesis flow [1][2][3][4][5][6] is adopted regularly for realizing various arithmetic and logical functions, including higher operand bit-widths. However, these methods neither allow any room to augment custom cells toward arriving at the hierarchical design nor offer any design-space exploration to realize the hardwarereliable design.…”
Section: Introductionmentioning
confidence: 99%