2015 IEEE Radiation Effects Data Workshop (REDW) 2015
DOI: 10.1109/redw.2015.7336723
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Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA

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Cited by 27 publications
(7 citation statements)
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“…In [7], the authors investigate the thermal neutron sensitivity of a 40 nm SRAM in which they present a residual source of 10 B from doping in silicon. A characterization of SEUs in Xilinx 20 nm UltraScale Kintex FPGA is presented in [13], resulting in a cross-section comparison on devices with and without a technique to mitigate the effects under thermal neutron irradiation. Also, as presented in [14], the contribution of thermal-neutron-induced soft-error rate (SER) in 16-nm bulk FinFET flip-flops can be comparable with the high-energy-neutron-induced SER, showing variations for different flip-flops designs, owing to different 10 B contamination and different critical charge values.…”
Section: Introductionmentioning
confidence: 99%
“…In [7], the authors investigate the thermal neutron sensitivity of a 40 nm SRAM in which they present a residual source of 10 B from doping in silicon. A characterization of SEUs in Xilinx 20 nm UltraScale Kintex FPGA is presented in [13], resulting in a cross-section comparison on devices with and without a technique to mitigate the effects under thermal neutron irradiation. Also, as presented in [14], the contribution of thermal-neutron-induced soft-error rate (SER) in 16-nm bulk FinFET flip-flops can be comparable with the high-energy-neutron-induced SER, showing variations for different flip-flops designs, owing to different 10 B contamination and different critical charge values.…”
Section: Introductionmentioning
confidence: 99%
“…The SEU cross section for the Kintex-7 configuration memory has been studied through proton and neutron irradiations in the past: by reading back the configuration-memory bitstream after irradiation with 180-MeV [5], 105-MeV [7], and 64-MeV protons [29] and TSL neutrons [5], by using the Xilinx SEM core during irradiation with 35-MeV protons [30], by using custom error detection and correction firmware during irradiation with 30-MeV protons [31], and by using an external scrubber providing error detection and correction during irradiation with 62-MeV protons [32]. These experiments were performed on different devices than in the present work, using FPGA part numbers XCK70T [30], [32] and XCK325T [5], [7], [29], [31] (compared to XCK160T used in the present work).…”
Section: Discussionmentioning
confidence: 99%
“…We ran benchmark and validation tests to determine the processing throughput and latency using a Xilinx KU060 FPGA [42]. Our choice of an XCKU060 FPGA was based on our initial estimate of the required resources as well as its ongoing path to spaceflight qualification [43,44]. This is the same FPGA chosen for the prototype version of SALi [11].…”
Section: Data Processing Time With a Xcku060 Fpgamentioning
confidence: 99%