2005
DOI: 10.1002/pssc.200460669
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Neutron scattering study of structural and magnetic properties of hexagonal MnTe

Abstract: Single crystals of hexagonal MnTe (in NiAs structure) have been grown by the physical vapour transport method and investigated by neutron scattering techniques. Lattice parameters and magnetic intensity of Bragg peaks characteristic of the antiferromagnetic order of the first kind have been measured by elastic neutron scattering in the temperature range from T = 10 K to the Néel temperature T N = 310 K. A smooth temperature dependence of the lattice parameter values a and c as well as of the c/a ratio has been… Show more

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Cited by 30 publications
(22 citation statements)
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“…Furthermore, the crystals were subjected to the high temperature annealing (within 900-950 • C) in Te vapour (see Refs. [2,10] and references therein). X-ray diffraction (XRD) measurements of the obtained samples [2] indicated their single-phase structure (H-MnTe) in a form of large grain polycrystals (of order of 1 mm in diameter).…”
Section: Methodsmentioning
confidence: 97%
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“…Furthermore, the crystals were subjected to the high temperature annealing (within 900-950 • C) in Te vapour (see Refs. [2,10] and references therein). X-ray diffraction (XRD) measurements of the obtained samples [2] indicated their single-phase structure (H-MnTe) in a form of large grain polycrystals (of order of 1 mm in diameter).…”
Section: Methodsmentioning
confidence: 97%
“…In fact, MnS, MnSe and MnTe are antiferromagnetics with the respective Neel temperatures (T N ) equal 152 K [7], 247 K [8] and 307 K [9] (see also Refs. [5,10]). Due to the above mentioned peculiarities, H-MnTe has been classified as a "crossroads" material (see Refs.…”
Section: Introductionmentioning
confidence: 96%
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“…MnTe crystallizing in NiAs structure is a good example of such semiconductor. Only due to an increase of Mn Te bond length between 4.2 K (the liquid helium temperature) and 295 K in this compound (see, e.g., [36]) the expected change of the exchange integral should be as high as J 1 /J 1 ≈ 0.07. For Ga 1−x Mn x As which exhibit the ferromagnetic properties up to 170 K the expected difference between the low and high temperature values of the exchange integral J is much smaller ( J /J ≈ 0.002).…”
Section: The Effect Of Temperaturementioning
confidence: 98%
“…The bulk MnTe (crystallizing in NiAs structure) exhibits T N = 310 K [36], whereas T N = 284 K was observed for MnTe layer with the same structure grown on Al 2 O 3 substrate [37]. The T N value determined by the temperature dependence of the magnon frequency (which is given by the combination of the exchange integrals) observed by Raman scattering for zinc blende (ZB) modification of MnTe is also different for thin layers of this compound grown on GaAs and Cd 1−x Zn x Te substrates, as it was shown in [38].…”
Section: The Strain Effectsmentioning
confidence: 99%