New Cell Structure with Edge-thick Tunnel Oxide for Highly Reliable NAND Flash Memory Devices

Kim, Tae‐Kyung; Song, Jaihyuk; Lee, Changsub; Oh, Dongyean; Jang, Taeseok; Lim, Jong-Kwang; Lee, Dongjun; Lee, Seungjun; Lim, Minhwan; Shim, Hyunyoung; Park, Bongtae; Lee, Man-Ki; Lee, Hunkook

doi:10.1109/.2006.1629484

2006 21st IEEE Non-Volatile Semiconductor Memory Workshop

DOI: 10.1109/.2006.1629484

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New Cell Structure with Edge-thick Tunnel Oxide for Highly Reliable NAND Flash Memory Devices

Tae‐Kyung Kim

Jaihyuk Song

Changsub Lee

et al.

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New Cell Structure with Edge-thick Tunnel Oxide for Highly Reliable NAND Flash Memory Devices

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