New chalcogenides of the type M+0.5In0.5M3+2X4

Robbins, M.; Mikšovský, M.

doi:10.1016/0025-5408(71)90169-3

Cited by 54 publications

(12 citation statements)

References 2 publications

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“…Interestingly, our findings for Xe/Ag differ from those on Kr/Au. As recently shown by Robbins and Krim [22], the Kr/Au QCM data up to monolayer coverage can be fitted rather well assuming negligible electronic friction. A finite electronic friction would require a correspondingly smaller substrate corrugation u 0 which, in turn, would yield too low values of the phonon friction at submonolayer coverages.…”

Section: Comparison With Experimentssupporting

confidence: 62%

Electronic versus phononic friction of xenon on silver

1999

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Molecular dynamics simulations of a Xe monolayer sliding on Ag(001) and Ag(111) are carried out in order to ascertain the microscopic origin of friction. For several values of the electronic contribution to the friction of individual Xe atoms, the intra-overlayer phonon dissipation is calculated as a function of the corrugation amplitude of the substrate potential, which is a pertinent parameter to consider. Within the accuracy of the numerical results and the uncertainty with which the values of the relevant parameters are known at present, we conclude that electronic and phononic dissipation channels are of similar importance. While phonon friction gives rise to the rapid variation with coverage, the electronic friction provides a roughly coverage-independent contribution to the overall sliding friction.

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Section: Comparison With Experimentssupporting

confidence: 62%

Electronic versus phononic friction of xenon on silver

1999

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“…2a) show amorphous structure in nature. However, under thermal treatment the spectra demonstrate that the films have been always grown with a preferred (3 1 1) orientation according to the angular positions at (2Â = 27.84 • ) which we have assigned to the cubic CuIn 5 S 8 spinel phase, this result is in agree with which reported by several authors [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22]. It is also evident from the figure that two different types of films could be distinguished.…”

Section: Structural Of Cuin 5 S 8 Powdersupporting

confidence: 94%

“…1, XRD pattern of the source powder indicates that it has a single phase of cubic spinel structure and not another phase which exists in the structure. This was verified by JCPDS (Joint Committee on Powder Diffraction Standards) database with card number 24-361 [18]. The main peaks are located at 2Â values of 27.84 • , 33.67 • , 44.15 • and 48.36 • with the reflection planes of (3 1 1), (4 0 0), (5 1 1) and (4 4 0) respectively.…”

Section: Structural Of Cuin 5 S 8 Powdermentioning

confidence: 99%

Structural, optical and electrical properties of CuIn5S8 thin films grown by thermal evaporation method

Gannouni

Kanzari

2011

Journal of Alloys and Compounds

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“…Ternary sulfide compound AgIn 5 S 8 is an n-type semiconductor with direct band gap of about 1.7 eV, which has the cubic spinel structure with the space symmetry group Fd3m [14,15]. AgIn 5 S 8 can be derived from the CdIn 2 S 4 crystal, if the divalent Cd cation is replaced by the univalent Ag cation and the trivalent In cation, according to…”

Section: Introductionmentioning

confidence: 99%