2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)
DOI: 10.1109/issm.2001.963021
|View full text |Cite
|
Sign up to set email alerts
|

New chemical removing and air cooling technology for clean room recirculation air using chilled pure water showering method

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…Wakamatsu et al (2000) developed a cooled-type, two-stage air washer in make-up air units to remove high-concentration AMCs from intake-air. Furthermore, Wakamatsu et al (2001) used 7 C pure water showering to remove water-soluble substances, such as NH þ 4 and amine ions, for cleanroom recirculation air. Ishihara et al (2000) proposed a molecular contamination-free clean dry air (CDA) system for atmosphere control in a closed manufacturing system and confirmed that concentration of each contaminant was less than 10 ppb.…”
Section: Limitation Of Chemical Filtersmentioning
confidence: 99%
“…Wakamatsu et al (2000) developed a cooled-type, two-stage air washer in make-up air units to remove high-concentration AMCs from intake-air. Furthermore, Wakamatsu et al (2001) used 7 C pure water showering to remove water-soluble substances, such as NH þ 4 and amine ions, for cleanroom recirculation air. Ishihara et al (2000) proposed a molecular contamination-free clean dry air (CDA) system for atmosphere control in a closed manufacturing system and confirmed that concentration of each contaminant was less than 10 ppb.…”
Section: Limitation Of Chemical Filtersmentioning
confidence: 99%