2004
DOI: 10.1017/s1431927604884083
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New Detection System for GEMINI

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Cited by 22 publications
(9 citation statements)
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“…The fracture surface of dry iron ore green pellets was observed using an enhanced GEMINI II column on a Merlin SEM (Zeiss, Oberkochen, Germany). This sample was first imaged at 1.50 kV with the energy selective backscatter detector (an annular in-lens detector), and the negatively biased filtering grid at 1.45 kV to gain compositional contrast (Steigerwald, 2004). The regions appearing with distinct gray levels were analyzed by energy dispersive spectroscopy (EDS) at 3 kV and 1 nA with an X-Max 50 mm 2 X-ray detector (Oxford Instruments, Abingdon, UK) to distinguish and localize silicates.…”
Section: Methodsmentioning
confidence: 99%
“…The fracture surface of dry iron ore green pellets was observed using an enhanced GEMINI II column on a Merlin SEM (Zeiss, Oberkochen, Germany). This sample was first imaged at 1.50 kV with the energy selective backscatter detector (an annular in-lens detector), and the negatively biased filtering grid at 1.45 kV to gain compositional contrast (Steigerwald, 2004). The regions appearing with distinct gray levels were analyzed by energy dispersive spectroscopy (EDS) at 3 kV and 1 nA with an X-Max 50 mm 2 X-ray detector (Oxford Instruments, Abingdon, UK) to distinguish and localize silicates.…”
Section: Methodsmentioning
confidence: 99%
“…Low-loss BSE imaging has been shown to have a notably reinforced compositional contrast with no topographical contrast (there are no SEs imaged) (Rosenberg et al, 1999). Consequently, recent advances in field emission electron microcopy (FESEM) have allowed imaging of coaxial low-loss BSEs (high angle BSEs typically in a cone with a 15 degress angle to the primary electron beam) using the specialized detection geometry coupled with an in-column energy-selective BSE (EsB) detector (Steigerwald et al, 2004). The detected BSEs would be those that pass through the objective lens, and are projected directly to a different detector plane, due to the higher energy than SEs.…”
Section: Introductionmentioning
confidence: 99%
“…The Auriga instrument is a crossbeam FIB instrument, but only the electron beam column was used for image formation, which means that it was used as a standard SEM. All SEM images were acquired using an In-lens Secondary Electron (SE) detector [12,13], and a beam energy of 5 keV. Two electrochemically etched tungsten tips were connected to two Kleindiek micromanipulators equipped with low current plug-ins [14].…”
Section: Methodsmentioning
confidence: 99%