2010
DOI: 10.1007/978-3-642-03160-1
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New Horizons of Applied Scanning Electron Microscopy

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Cited by 33 publications
(17 citation statements)
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“…To overcome this key difficulty that is combined to the well-known problem of contamination in SEM, the most unique strategy would be to clean the sample just before its visualization and to use standards of known composition set side by side to the investigated sample. Sample and standards have to be implemented simultaneously to an efficient cleaning process [59], in order to minimize deviations between the work functions (and then between the SEE yields) of sample compounds and of standards of the same composition. Next a simple comparison between the grey levels of the standards and of the sample may permit a spatial localization of the various components in the SEM images.…”
Section: Complementsmentioning
confidence: 99%
“…To overcome this key difficulty that is combined to the well-known problem of contamination in SEM, the most unique strategy would be to clean the sample just before its visualization and to use standards of known composition set side by side to the investigated sample. Sample and standards have to be implemented simultaneously to an efficient cleaning process [59], in order to minimize deviations between the work functions (and then between the SEE yields) of sample compounds and of standards of the same composition. Next a simple comparison between the grey levels of the standards and of the sample may permit a spatial localization of the various components in the SEM images.…”
Section: Complementsmentioning
confidence: 99%
“…Scanning electron microscopy (SEM) can image various sample surfaces by scanning them with an electron beam (Goldstein et al, 2003;Hodges and Hallowers, 1980;Shimizu and Mitani, 2009). SEM is widely used for surface observations in basic and applied biology, industries, and other fields.…”
Section: Introductionmentioning
confidence: 99%
“…After evacuation, Ar gas was introduced at a pressure of 650 Pa. An rf glow discharge was operated at an applied power of 20 W. It has been reported that this sputtering condition is suitable to have modified surface of the steel sample depending on crystal orientation. 1,2) A FE-SEM (Ultra55, SII Nano Tech., Carl Zeiss Co.) was used for surface observation. This instrument has a built-in lens-type secondary electron detector and an energy selective backscattered electron detector.…”
Section: Methodsmentioning
confidence: 99%
“…However, it has been reported that in the case of rf glow discharge, more "moderate" or "mild" sputtering is possible. 1,7) In this case, the damage on the surface of the sample induced by Ar sputtering is drastically reduced. This discharge condition is suitable for low-voltage FE-SEM observation.…”
Section: Introductionmentioning
confidence: 99%