New improvements in energy and spatial (x, y, z) resolution in AES and XPS applications

Reniers, François; Tewell, Craig R.

doi:10.1016/j.elspec.2004.07.004

Cited by 62 publications

(36 citation statements)

References 116 publications

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“…Over the past several decades, high resolution X-ray photoelectron spectroscopy has become very popular due to significant improvements in energy resolution [51]. The great number of publications demonstrates that XPS can provide trustworthy information regarding the physico-chemistry of a material surface.…”

Section: Xps Core-level and Valence Band: Fwhm Lineshapes And Chemicmentioning

confidence: 99%

“…Where is the full width at half-maximum (FWHM) of the x-ray line, is the proper absolute energy resolution of the analyzer operating in the constant analyzer transmission (CAT) mode, which depends on the pass energy applied [51], is the natural line width of the orbital in the atom, and it has been assumed that each component can be represented by a Gaussian function. As the analyzer energy window can be selected so that it does not limit the resolution, the energy resolution is often controlled by the width of the X-ray line and by the intrinsic width of .…”

Section: Eq1mentioning

confidence: 99%

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Challenges in the characterization of plasma polymers using XPS

Nisol

Reniers

2015

Journal of Electron Spectroscopy and Related Phenomena

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Section: Xps Core-level and Valence Band: Fwhm Lineshapes And Chemicmentioning

confidence: 99%

Section: Eq1mentioning

confidence: 99%

Challenges in the characterization of plasma polymers using XPS

Nisol

Reniers

2015

Journal of Electron Spectroscopy and Related Phenomena

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“…Quantification through spectra fitting. 122 • Relative energy resolution: 0.05% (SCA/CHA analyzer) 133 • Lateral resolution: <10 nm 122 • Detection limit: 0.1 at.% 122…”

Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning

confidence: 99%

Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

et al. 2017

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ABSTRACT:Recently, there has been an explosive growth in research based on hybrid lead-halide perovskites for photovoltaics owing to rapid improvements in efficiency. The advent of these materials for solar applications has led to widespread interest in understanding the key enabling properties of these materials. This has resulted in renewed interest in related compounds and a search for materials that may replicate the defect-tolerant properties and long lifetimes of the hybrid lead-halide perovskites. Given the rapid pace of development of the field, the rises in efficiencies of these systems have outpaced the more basic understanding of these materials. Measuring or calculating the basic properties, such as crystal/electronic structure and composition, can be challenging because some of these materials have anisotropic structures, and/or are composed of both heavy metal cations and volatile, mobile, light elements. Some consequences are beam damage during characterization, composition change under vacuum, or compound effects, such as the alteration of the electronic structure through the influence of the substrate. These effects make it challenging to understand the basic properties integral to optoelectronic operation. Compounding these difficulties is the rapid pace with which the field progresses. This has created an ongoing need to continually evaluate best practices with respect to characterization and calculations, as well as to identify inconsistencies in reported values to determine if those inconsistencies are rooted in characterization methodology or materials synthesis. This article describes the difficulties in characterizing hybrid lead-halide perovskites and new materials, and how these challenges may be overcome. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 2 challenges discussed. The focus in this article is on crystallography, composition measurements, photoemission spectroscopy and calculations on perovskites and new, related absorbers. We suggest how some of the important artifacts could be avoided and how the reporting for each technique could be streamlined between groups to ensure reproducibility as the field progresses.

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“…Today, Auger electron spectroscopy (AES) (Reniers & Tewell, 2005;Zalar et al, 2005) and secondary ion (neutral) mass spectrometry (SIMS) (McPhail, 2006;Mulcahy et al, 2006) are suitable methods used for the depth profiling of the first atomic layers of a surface. SIMS is more sensitive and, therefore, wellsuited for low-concentration layers and dopant profiles.…”

Section: A State-of-the-art Surface Methods For Depth Profilingmentioning

confidence: 99%

Femtosecond laser ablation inductively coupled plasma mass spectrometry: Fundamentals and capabilities for depth profiling analysis

Pisonero

Günther

2008

Mass Spectrometry Reviews

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Laser ablation coupled to inductively coupled plasma mass spectrometry has become a versatile and powerful analytical method for direct solid analysis. The applicability has been demonstrated on a wide variety of samples, where major, minor, and trace element concentrations or isotope ratio determinations have been of interest. The pros and cons of UV-nsec laser ablation have been studied in detail, and indicate that aerosol generation, aerosol transport, and aerosol excitation-ionization within the ICP contribute to fractionation effects, which prevent this method from a more universal application to all matrices and all elements. Recent progresses in IR-fs and UV-fs laser ablation coupled to ICP-MS have been reported, which increase the inter-matrix and multi-element quantification capabilities of this method. These fundamental improvements in LA-ICP-MS are of significant importance for entering new applications in material science and related research fields. In particular, because coatings (conducting and non-conducting) consist of single or multilayers of various elemental composition and of different thickness (nm-mm range), significant progress in the field of depth profiling with fs-laser ablation can be expected. Therefore, in-depth profile analysis of polymers, semiconductors, and metal sample investigations, using ultra-fast laser ablation for sampling and the currently achievable figures of merit, are discussed. In this review manuscript, the enhanced capabilities of fs-LA-ICP-MS for direct solid sampling are highlighted, and it is discussed about current methods used for quantitative analysis and depth profiling, the ablation process of UV-ns and UV-fs, the influence of the laser beam profile, aerosol structure and transport efficiency, as well as the influence of the ICP-MS (e.g., vaporization and ionization efficiency in the plasma, and type of mass analyzer).

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New improvements in energy and spatial (x, y, z) resolution in AES and XPS applications

Cited by 62 publications

References 116 publications

Challenges in the characterization of plasma polymers using XPS

Challenges in the characterization of plasma polymers using XPS

Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

Femtosecond laser ablation inductively coupled plasma mass spectrometry: Fundamentals and capabilities for depth profiling analysis

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