2020
DOI: 10.1016/j.matlet.2020.127467
|View full text |Cite
|
Sign up to set email alerts
|

New materials in semiconductor tensometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
1
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 9 publications
(2 citation statements)
references
References 3 publications
0
1
0
Order By: Relevance
“…A modified algorithm for identifying structural damage at varying temperature and its effect on Young’s modulus is presented in [ 23 ]. New materials for measuring forces and deformations in a wide range of loads of external factors and radiation resistance are presented in [ 24 ].…”
Section: Relative Workmentioning
confidence: 99%
“…A modified algorithm for identifying structural damage at varying temperature and its effect on Young’s modulus is presented in [ 23 ]. New materials for measuring forces and deformations in a wide range of loads of external factors and radiation resistance are presented in [ 24 ].…”
Section: Relative Workmentioning
confidence: 99%
“…ortalarından itibaren büyük bir gelişim sürecine girmiştir. Gelişim sürecinde atılan adımlar yarıiletkenlerin farklı malzemelerle çeşitlendirilmesini ve yeni yarıiletken malzeme sınıflarının ortaya çıkarılmasını sağlamıştır (Tromer et al 2021, Tuktarov et al 2021, Bronovets et al 2020.…”
Section: Introductionunclassified