New Observations of FN Stress Induced Performance Degradation of RF MOSFETs

Xiao, Bing; Zhang, L.; Huang, Ru; Wu, Dong; Song, Frank M.; Wang, Y. Y.

doi:10.7567/ssdm.2009.p-3-11

Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials 2009

DOI: 10.7567/ssdm.2009.p-3-11

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New Observations of FN Stress Induced Performance Degradation of RF MOSFETs

Bing Xiao

L. Zhang

Ru Huang

et al.

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New Observations of FN Stress Induced Performance Degradation of RF MOSFETs

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