New physical model for lifetime estimation of power modules

Kovačević, Ivana F.; Drofenik, U.; Kolar, Johann W.

doi:10.1109/ipec.2010.5543755

Cited by 155 publications

(111 citation statements)

References 14 publications

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“…Another mathematical formulation of the Coffin-Manson model which besides the temperature variation ΔT j takes also into consideration the medium temperature Tm is shown in (3) [83]. (3) Here k the Boltzmann constant and E a the activation energy parameter.…”

Section: B Lifetime Modelmentioning

confidence: 99%

Review of Power Semiconductor Device Reliability for Power Converters

et al. 2017

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Section: B Lifetime Modelmentioning

confidence: 99%

Review of Power Semiconductor Device Reliability for Power Converters

et al. 2017

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“…The expected lifetime λ can be calculated from the lifetime models based on damage accumulation [7]. By routing the power within the system, the junction temperature is influenced and the stress is reduced for the unloaded parts of the system, while the stress for higher loaded parts is increased.…”

Section: Power Routing Conceptmentioning

confidence: 99%

Comparison of voltage control methods of CHB converters for power routing in smart transformer

Raveendran

Buticchi

Mercante³

2017

2017 IEEE Energy Conversion Congress and Exposition (ECCE)

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Abstract-For Smart Transformers (ST), reliability is one of the major problems when compared to the traditional lowfrequency transformers. Modular ST with advanced control algorithms could increase the reliability compared to the nonmodular solutions. This could be achieved by distributing differently the power among the cells depending on their aging. This unequal power transfer is a challenge for Cascaded HBridge converters (CHB). ST based on a CHB rectifier with different capacitor voltage balancing schemes are analyzed in the paper. The goal is to evaluate the best scheme for unequal power transfer while maintaining the dc-link voltages constant. The paper focuses on validating the operating power unbalance limits of each cell of the modular system for unbalanced power transfer while maintaining the voltage balance in the medium voltage dc-link stage. The power unbalance limits are established with analytical calculations and verified through simulations and experiments.

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“…The lifetime prediction research on power devices is transitioning from handbook-based approaches [18], [19] to more physics-based methods, which require in-depth understanding of various failure mechanisms and thus dedicated lifetime models, e.g. an analytical based Confin-Mason model [12]- [14], [16]. Among these failure factors, thermal stresses, depending on the mission profile as well as the inverter operating conditions, have been the most observed ones in PV systems (both inverters and capacitors) [17], [20].…”

Section: Introductionmentioning

confidence: 99%

“…Moreover, the widely used lifetime models unfortunately consider only a few failure modes, e.g. the junction temperature cycle amplitude and the mean junction temperature [16], [19]- [22]. However, improving the lifetime estimation accuracy requires an elaborated analysis of a long-term mission profile, and also a detailed reliability model.…”

Section: Introductionmentioning

confidence: 99%

Improved reliability of single-phase PV inverters by limiting the maximum feed-in power

Yang

Wang

Blaabjerg

2014

2014 IEEE Energy Conversion Congress and Exposition (ECCE)

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Abstract-Grid operation experiences have revealed the necessity to limit the maximum feed-in power from PV inverter systems under a high penetration scenario in order to avoid voltage and frequency instability issues. A Constant Power Generation (CPG) control method has been proposed at the inverter level. The CPG control strategy is activated only when the DC input power from PV panels exceeds a specific power limit. It enables to limit the maximum feed-in power to the electric grids and also to improve the utilization of PV inverters. As a further study, this paper investigates the reliability performance of the power devices (e.g. IGBTs) used in PV inverters with the CPG control under different feed-in power limits. A long-term mission profile (i.e. solar irradiance and ambient temperature) based stress analysis approach is extended and applied to obtain the yearly electrical and thermal stresses of the power devices, allowing a quantitative prediction of the power device lifetime. A study case on a 3 kW single-phase PV inverter has demonstrated the advantages of the CPG control in terms of improved reliability.

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New physical model for lifetime estimation of power modules

Cited by 155 publications

References 14 publications

Review of Power Semiconductor Device Reliability for Power Converters

Review of Power Semiconductor Device Reliability for Power Converters

Comparison of voltage control methods of CHB converters for power routing in smart transformer

Improved reliability of single-phase PV inverters by limiting the maximum feed-in power

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