2011 International Conference on Electrical and Control Engineering 2011
DOI: 10.1109/iceceng.2011.6057872
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New sensitivity normalization in electrical tomography

Abstract: Due to the shortcoming of linear normalization for sensitivity in electrical tomography system, nonlinear formulas are derived about electrical resistance tomography (ERT) , capacitance tomography (ECT) and electromagnetic tomography (EMT). Those formulas are deduced according to the characteristics of analytical solution and system structure. The role of normalization in data processing is introduced. Logarithmic normalization formula is summarized for ERT. In ECT, parallel model and serial model are introduc… Show more

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